TY - JOUR
T1 - Ion beam analysis at cryogenic temperatures for polymer light emitting diodes
AU - van IJzendoorn, L.J.
AU - de Jong, M.P.
AU - Janssen, F.J.J.
AU - Andersson, G.G.
AU - Sturm, J.M.
AU - de Voigt, M.J.A.
PY - 2002/4
Y1 - 2002/4
N2 - The application of ion beam analysis on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temperatures (10–30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A number of examples are reviewed in which interface stability and oxidation effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection.
AB - The application of ion beam analysis on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temperatures (10–30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A number of examples are reviewed in which interface stability and oxidation effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection.
U2 - 10.1016/S0168-583X(01)01005-9
DO - 10.1016/S0168-583X(01)01005-9
M3 - Article
VL - 188
SP - 36
EP - 40
JO - Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms
JF - Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms
SN - 0168-583X
IS - 1-4
ER -