Ion beam analysis at cryogenic temperatures for polymer light emitting diodes

L.J. van IJzendoorn, M.P. de Jong, F.J.J. Janssen, G.G. Andersson, J.M. Sturm, M.J.A. de Voigt

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The application of ion beam analysis on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temperatures (10–30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A number of examples are reviewed in which interface stability and oxidation effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection.
Original languageEnglish
Pages (from-to)36-40
JournalNuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms
Volume188
Issue number1-4
DOIs
Publication statusPublished - Apr 2002
Externally publishedYes

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