Abstract
The application of ion beam analysis on polymer light emitting diodes became possible by the development of a set-up which allows measurements at cryogenic temperatures (10–30 K). The set-up is equipped with a sample holder which combines compatibility with a load-lock, necessary for introduction of samples under controlled conditions, and a good thermal contact. A number of examples are reviewed in which interface stability and oxidation effects in poly-LEDs are studied with Rutherford backscattering spectrometry and elastic recoil detection.
Original language | English |
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Pages (from-to) | 36-40 |
Journal | Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms |
Volume | 188 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - Apr 2002 |
Externally published | Yes |