Jitter and Decision-level Noise Separation in A/D Converters

R.J.W.T. Tangelder; H. de Vries; R. Rosing; Hans G. Kerkhoff; M. Sachdev

doi:10.1109/IMTC.1999.776087

Jitter and Decision-level Noise Separation in A/D Converters

R.J.W.T. Tangelder, H. de Vries, R. Rosing, Hans G. Kerkhoff, M. Sachdev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

13 Citations (Scopus)

49 Downloads (Pure)

Abstract

Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed

Original language	English
Title of host publication	IMTC '99
Subtitle of host publication	proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1558-1562
Number of pages	5
Volume	3
ISBN (Print)	0-7803-5276-9
DOIs	https://doi.org/10.1109/IMTC.1999.776087
Publication status	Published - 24 May 1999
Event	16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999: Measurements for the New Millennium - Venice, Italy Duration: 24 May 1999 → 26 May 1999 Conference number: 16

Conference

Conference	16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999
Abbreviated title	ITMC
Country/Territory	Italy
City	Venice
Period	24/05/99 → 26/05/99

Keywords

Jitter
Decision-level noise
SDC testing
Diagnosis

Access to Document

10.1109/IMTC.1999.776087

Cite this

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title = "Jitter and Decision-level Noise Separation in A/D Converters",

abstract = "Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed",

keywords = "Jitter, Decision-level noise, SDC testing, Diagnosis",

author = "R.J.W.T. Tangelder and {de Vries}, H. and R. Rosing and Kerkhoff, {Hans G.} and M. Sachdev",

year = "1999",

month = may,

day = "24",

doi = "10.1109/IMTC.1999.776087",

language = "English",

isbn = "0-7803-5276-9",

volume = "3",

pages = "1558--1562",

booktitle = "IMTC '99",

publisher = "IEEE",

address = "United States",

note = "16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999 : Measurements for the New Millennium, ITMC ; Conference date: 24-05-1999 Through 26-05-1999",

}

Tangelder, RJWT, de Vries, H, Rosing, R, Kerkhoff, HG & Sachdev, M 1999, Jitter and Decision-level Noise Separation in A/D Converters. in IMTC '99: proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference. vol. 3, IEEE, Piscataway, NJ, pp. 1558-1562, 16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999, Venice, Italy, 24/05/99. https://doi.org/10.1109/IMTC.1999.776087

Jitter and Decision-level Noise Separation in A/D Converters. / Tangelder, R.J.W.T.; de Vries, H.; Rosing, R. et al.
IMTC '99: proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference. Vol. 3 Piscataway, NJ: IEEE, 1999. p. 1558-1562.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Jitter and Decision-level Noise Separation in A/D Converters

AU - Tangelder, R.J.W.T.

AU - de Vries, H.

AU - Rosing, R.

AU - Kerkhoff, Hans G.

AU - Sachdev, M.

N1 - Conference code: 16

PY - 1999/5/24

Y1 - 1999/5/24

N2 - Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed

AB - Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed

KW - Jitter

KW - Decision-level noise

KW - SDC testing

KW - Diagnosis

U2 - 10.1109/IMTC.1999.776087

DO - 10.1109/IMTC.1999.776087

M3 - Conference contribution

SN - 0-7803-5276-9

VL - 3

SP - 1558

EP - 1562

BT - IMTC '99

PB - IEEE

CY - Piscataway, NJ

T2 - 16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999

Y2 - 24 May 1999 through 26 May 1999

ER -

Jitter and Decision-level Noise Separation in A/D Converters

Abstract

Conference

Keywords

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