Jitter and Decision-level Noise Separation in A/D Converters

R.J.W.T. Tangelder, H. de Vries, R. Rosing, Hans G. Kerkhoff, M. Sachdev

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    12 Citations (Scopus)
    35 Downloads (Pure)

    Abstract

    Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed
    Original languageEnglish
    Title of host publicationIMTC '99
    Subtitle of host publicationproceedings of the 16th IEEE Instrumentation and Measurement Technology Conference
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages1558-1562
    Number of pages5
    Volume3
    ISBN (Print)0-7803-5276-9
    DOIs
    Publication statusPublished - 24 May 1999
    Event16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999: Measurements for the New Millennium - Venice, Italy
    Duration: 24 May 199926 May 1999
    Conference number: 16

    Conference

    Conference16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999
    Abbreviated titleITMC
    CountryItaly
    CityVenice
    Period24/05/9926/05/99

    Keywords

    • Jitter
    • Decision-level noise
    • SDC testing
    • Diagnosis

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