Judd-Ofelt analysis of Nd(TTa)3Phen-doped 6-FDA/Epoxy planar waveguides

J. Yang, Mart Diemeer, L.T.H. Hilderink, R. Dekker, A. Driessen

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    Abstract

    The fluorescent complex $Nd(TTA)_{3}Phen$ (TTA=thenoyltrifluoroacetone, Phen = 1, 10-phenanthroline), was doped into the host material 6-FDA epoxy (6-fluorinated-dianhydride cured epoxy). The room-temperature absorption spectrum of $N^{3}$ transitions was experimentally obtained, with which the Judd-Ofelt model was applied to determine the Judd-Ofelt parameters. These parameters are used to calculate the emission probabilities of transitions and branching ratios of the $Nd_{3}$ from the excited-state $^{4}F_{3/2}$ to lower-lying manifolds. The radiative lifetime of $^{4}F_{3/2}$ was obtained from the emission probabilities. The results of the analysis indicate this Nd (III) complex doped polymer material is promising to be used in planar waveguide lasers and amplifiers.
    Original languageUndefined
    Title of host publication11th Annual Symposium IEEE/LEOS Benelux
    EditorsA.M.J. Koonen, X.J.M. Leijtens, H.P.A. van den Boom, E.J.M. Verdurmen, J. Molina Vasquez
    Place of PublicationEindhoven
    PublisherIEEE/LEOS Benelux Chapter
    Pages253-256
    Number of pages4
    ISBN (Print)90-6144-989-8
    Publication statusPublished - 30 Nov 2006
    Event11th Annual Symposium IEEE/LEOS Benelux Chapter 2006 - Eindhoven, The Netherlands, Eindhoven, Netherlands
    Duration: 30 Nov 20061 Dec 2006
    Conference number: 11

    Publication series

    Name
    PublisherIEEE/LEOS Benelux Chapter
    Number500-266

    Conference

    Conference11th Annual Symposium IEEE/LEOS Benelux Chapter 2006
    CountryNetherlands
    CityEindhoven
    Period30/11/061/12/06

    Keywords

    • IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY
    • EWI-8876
    • IR-66805
    • METIS-237850

    Cite this

    Yang, J., Diemeer, M., Hilderink, L. T. H., Dekker, R., & Driessen, A. (2006). Judd-Ofelt analysis of Nd(TTa)3Phen-doped 6-FDA/Epoxy planar waveguides. In A. M. J. Koonen, X. J. M. Leijtens, H. P. A. van den Boom, E. J. M. Verdurmen, & J. Molina Vasquez (Eds.), 11th Annual Symposium IEEE/LEOS Benelux (pp. 253-256). Eindhoven: IEEE/LEOS Benelux Chapter.