Kinetics and Domain Formation in Surface Reactions by Inverted Chemical Force Microscopy and FTIR Spectroscopy

Holger Schönherr, V. Chechik, C.J.M. Stirling, Gyula J. Vancso

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

6 Citations (Scopus)
Original languageUndefined
Title of host publicationInterfacial Properties on the Submicrometer Scale
EditorsJ. Frommer, R.M. Overney
PublisherAmerican Chemical Society
Pages-
Number of pages323
ISBN (Print)0-8412-3691-7
Publication statusPublished - 2001

Keywords

  • METIS-204973

Cite this

Schönherr, H., Chechik, V., Stirling, C. J. M., & Vancso, G. J. (2001). Kinetics and Domain Formation in Surface Reactions by Inverted Chemical Force Microscopy and FTIR Spectroscopy. In J. Frommer, & R. M. Overney (Eds.), Interfacial Properties on the Submicrometer Scale (pp. -). American Chemical Society.