Knowledge Based Image Analysis of Agricultural Fields in Remotely Sensed Images

Nanno Mulder; F. Luo

Knowledge Based Image Analysis of Agricultural Fields in Remotely Sensed Images

Nanno Mulder, F. Luo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the International Workshop Pattern Recognition in Practice IV: Multiple Paradigms, Comparative Studies and Hybrid Systems, machine Intelligence and Pattern Recognition, Vol 16
Place of Publication	Vlieland, The Netherlands
Pages	-
Number of pages	16
Publication status	Published - 1 Jun 1994

Keywords

METIS-113404

Cite this

@inproceedings{1c09232922ae4860bdc4d148b2cea95f,

title = "Knowledge Based Image Analysis of Agricultural Fields in Remotely Sensed Images",

keywords = "METIS-113404",

author = "Nanno Mulder and F. Luo",

year = "1994",

month = jun,

day = "1",

language = "Undefined",

pages = "--",

booktitle = "Proceedings of the International Workshop Pattern Recognition in Practice IV: Multiple Paradigms, Comparative Studies and Hybrid Systems, machine Intelligence and Pattern Recognition, Vol 16",

}

Knowledge Based Image Analysis of Agricultural Fields in Remotely Sensed Images. / Mulder, Nanno; Luo, F.
Proceedings of the International Workshop Pattern Recognition in Practice IV: Multiple Paradigms, Comparative Studies and Hybrid Systems, machine Intelligence and Pattern Recognition, Vol 16. Vlieland, The Netherlands, 1994. p. -.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Knowledge Based Image Analysis of Agricultural Fields in Remotely Sensed Images

AU - Mulder, Nanno

AU - Luo, F.

PY - 1994/6/1

Y1 - 1994/6/1

KW - METIS-113404

M3 - Conference contribution

SP - -

BT - Proceedings of the International Workshop Pattern Recognition in Practice IV: Multiple Paradigms, Comparative Studies and Hybrid Systems, machine Intelligence and Pattern Recognition, Vol 16

CY - Vlieland, The Netherlands

ER -