Abstract
Low-temperature scanning laser microscopy has been used to investigate the spatial variation of the critical temperature Tc and critical current Ic in thin-film high-Tc multilayer structures that include dielectric layers. The method is described and measurements are presented on an YBa2Cu3O7-x-based multiturn coil with SrTiO3 insulating layer. We found that the critical temperature Tc of the YBa2Cu3O7-x top layer, from which the return strip of the coil is formed, is higher than that of the YBa2Cu3O7-x base layer. The critical current of the coil is limited by the quality of the YBa2Cu3O7-x base layer and not by the edges of the crossovers.
Original language | Undefined |
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Pages (from-to) | 93-98 |
Number of pages | 6 |
Journal | Physica C |
Volume | 232 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1994 |
Keywords
- IR-23769
- METIS-128568