Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy

Jacobus Marinus Sturm, A. Zinine, Herbert Wormeester, R.G. Bankras, J. Holleman, Jurriaan Schmitz, Bene Poelsema

Research output: Contribution to journal › Article › Academic › peer-review

2 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy'. Together they form a unique fingerprint.