Leakage current measurements on pixelated CdZnTe detectors

B. Dirks, C. Blondel, F. Daly, O. Gevin, O. Limousin, F. Lugiez

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Abstract

In the field of the R&D of a new generation hard X-ray cameras for space applications we focus on the use of pixelated CdTe or CdZnTe semiconductor detectors. They are covered with 64 (0.9×0.9 mm2) or 256 (0.5×0.5 mm2) pixels, surrounded by a guard ring and operate in the energy ranging from several keV to 1 MeV, at temperatures between −20 and +20 °C. A critical parameter in the characterisation of these detectors is the leakage current per pixel under polarisation (∼50–500 V/mm). In operation mode each pixel will be read-out by an integrated spectroscopy channel of the multi-channel IDeF-X ASIC currently developed in our lab. The design and functionality of the ASIC depends directly on the direction and value of the current. A dedicated and highly insulating electronics circuit is designed to automatically measure the current in each individual pixel, which is in the order of tens of pico-amperes. Leakage current maps of different CdZnTe detectors of 2 and 6 mm thick and at various temperatures are presented and discussed. Defect density diagnostics have been performed by calculation of the activation energy of the material.
Original languageEnglish
Pages (from-to)145-149
JournalNuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment
Volume567
Issue number1
DOIs
Publication statusPublished - 2006

Keywords

  • IR-78487
  • CdTe/CdZnTe
  • Activation energy
  • Leakage current
  • X-ray detection
  • Pixels

Fingerprint Dive into the research topics of 'Leakage current measurements on pixelated CdZnTe detectors'. Together they form a unique fingerprint.

Cite this