Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

P. Le Minh, N.A. Akil, V.E. Houtsma, P.H. Woerlee, Hans Wallinga, Albert van den Berg, J. Holleman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	SAFE'99
Place of Publication	Mierlo, The Netherlands
Pages	265-268
Number of pages	4
Publication status	Published - 24 Nov 1999
Event	Annual Workshop on Semiconductor Advances for Future Electronics, SAFE'99 - Mierlo, Netherlands Duration: 24 Nov 1999 → 25 Nov 1999

Conference	Annual Workshop on Semiconductor Advances for Future Electronics, SAFE'99
Abbreviated title	SAFE
Country/Territory	Netherlands
City	Mierlo
Period	24/11/99 → 25/11/99

Keywords

@inproceedings{236e5bae7cdd40e7956cc57e60f54dfd,

title = "Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure",

keywords = "METIS-113886, IR-17001",

author = "{Le Minh}, P. and N.A. Akil and V.E. Houtsma and P.H. Woerlee and Hans Wallinga and {van den Berg}, Albert and J. Holleman",

year = "1999",

month = nov,

day = "24",

language = "Undefined",

isbn = "90-73461-18-9",

pages = "265--268",

booktitle = "SAFE'99",

note = "Annual Workshop on Semiconductor Advances for Future Electronics, SAFE'99 ; Conference date: 24-11-1999 Through 25-11-1999",

}

TY - GEN

T1 - Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

AU - Le Minh, P.

AU - Akil, N.A.

AU - Houtsma, V.E.

AU - Woerlee, P.H.

AU - Wallinga, Hans

AU - van den Berg, Albert

AU - Holleman, J.

PY - 1999/11/24

Y1 - 1999/11/24

KW - METIS-113886

KW - IR-17001

M3 - Conference contribution

SN - 90-73461-18-9

SP - 265

EP - 268

BT - SAFE'99

CY - Mierlo, The Netherlands

T2 - Annual Workshop on Semiconductor Advances for Future Electronics, SAFE'99

Y2 - 24 November 1999 through 25 November 1999

ER -