Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

P. Le Minh, N.A. Akil, V.E. Houtsma, P.H. Woerlee, Hans Wallinga, Albert van den Berg, J. Holleman

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationSAFE'99
    Place of PublicationMierlo, The Netherlands
    Pages265-268
    Number of pages4
    Publication statusPublished - 24 Nov 1999
    EventAnnual Workshop on Semiconductor Advances for Future Electronics, SAFE'99 - Mierlo, Netherlands
    Duration: 24 Nov 199925 Nov 1999

    Conference

    ConferenceAnnual Workshop on Semiconductor Advances for Future Electronics, SAFE'99
    Abbreviated titleSAFE
    CountryNetherlands
    CityMierlo
    Period24/11/9925/11/99

    Keywords

    • METIS-113886
    • IR-17001

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