Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

P. Le Minh; N.A. Akil; V.E. Houtsma; P.H. Woerlee; Hans Wallinga; Albert van den Berg; J. Holleman

Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

P. Le Minh
, N.A. Akil
, V.E. Houtsma
, P.H. Woerlee
, Hans Wallinga
, Albert van den Berg
, J. Holleman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics
Subtitle of host publication	proceedings : 24-26 November, 1999
Place of Publication	Utrecht
Publisher	STW
Pages	265-268
Number of pages	4
ISBN (Print)	90-73461-18-9
Publication status	Published - 24 Nov 1999
Event	2nd Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 1999 - Mierlo, Netherlands Duration: 24 Nov 1999 → 25 Nov 1999

Conference

Conference	2nd Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 1999
Abbreviated title	SAFE
Country/Territory	Netherlands
City	Mierlo
Period	24/11/99 → 25/11/99

Cite this

Le Minh, P., Akil, N. A., Houtsma, V. E., Woerlee, P. H., Wallinga, H., van den Berg, A., & Holleman, J. (1999). Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. In ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics: proceedings : 24-26 November, 1999 (pp. 265-268). STW.

Le Minh, P. ; Akil, N.A. ; Houtsma, V.E. et al. / Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics: proceedings : 24-26 November, 1999. Utrecht : STW, 1999. pp. 265-268

@inproceedings{236e5bae7cdd40e7956cc57e60f54dfd,

title = "Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure",

author = "\{Le Minh\}, P. and N.A. Akil and V.E. Houtsma and P.H. Woerlee and Hans Wallinga and \{van den Berg\}, Albert and J. Holleman",

year = "1999",

month = nov,

day = "24",

language = "English",

isbn = "90-73461-18-9",

pages = "265--268",

booktitle = "ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics",

publisher = "STW",

note = "2nd Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 1999, SAFE ; Conference date: 24-11-1999 Through 25-11-1999",

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Le Minh, P, Akil, NA, Houtsma, VE, Woerlee, PH, Wallinga, H, van den Berg, A & Holleman, J 1999, Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. in ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics: proceedings : 24-26 November, 1999. STW, Utrecht, pp. 265-268, 2nd Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 1999, Mierlo, Netherlands, 24/11/99.

Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. / Le Minh, P.; Akil, N.A.; Houtsma, V.E. et al.
ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics: proceedings : 24-26 November, 1999. Utrecht: STW, 1999. p. 265-268.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure

AU - Le Minh, P.

AU - Akil, N.A.

AU - Houtsma, V.E.

AU - Woerlee, P.H.

AU - Wallinga, Hans

AU - van den Berg, Albert

AU - Holleman, J.

PY - 1999/11/24

Y1 - 1999/11/24

M3 - Conference contribution

SN - 90-73461-18-9

SP - 265

EP - 268

BT - ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics

PB - STW

CY - Utrecht

T2 - 2nd Annual Workshop on Semiconductor Advances for Future Electronics, SAFE 1999

Y2 - 24 November 1999 through 25 November 1999

ER -

Le Minh P, Akil NA, Houtsma VE, Woerlee PH, Wallinga H, van den Berg A et al. Light Emission Spectra as Experimental Evidence for the Morphology of Silicon-based Antifuse Diode Structure. In ProRISC/IEEE 10th Annual Workshop on Circuits and Systems and Signal Processing and STW/SAFE 2nd Annual Workshop on Semiconductor Advances for Future Electronics: proceedings : 24-26 November, 1999. Utrecht: STW. 1999. p. 265-268