Likelihood Ratio-Based Biometric Verification

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    Original languageUndefined
    Title of host publicationProceedings of the ProRISC workshop on Circuits, Systems and Signal Processing
    Place of PublicationVeldhoven, The Netherlands
    Pages181-189
    Number of pages9
    Publication statusPublished - 27 Nov 2002

    Keywords

    • METIS-206912

    Cite this

    Bazen, A. M., & Veldhuis, R. N. J. (2002). Likelihood Ratio-Based Biometric Verification. In Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing (pp. 181-189). Veldhoven, The Netherlands.