Likelihood Ratio-Based Biometric Verification

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC workshop on Circuits, Systems and Signal Processing
    Place of PublicationVeldhoven, The Netherlands
    Pages181-189
    Number of pages9
    Publication statusPublished - 27 Nov 2002

    Keywords

    • METIS-206912

    Cite this

    Bazen, A. M., & Veldhuis, R. N. J. (2002). Likelihood Ratio-Based Biometric Verification. In Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing (pp. 181-189). Veldhoven, The Netherlands.
    Bazen, A.M. ; Veldhuis, Raymond N.J. / Likelihood Ratio-Based Biometric Verification. Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing. Veldhoven, The Netherlands, 2002. pp. 181-189
    @inproceedings{e727a98f23ba449891da8b1247f577fe,
    title = "Likelihood Ratio-Based Biometric Verification",
    keywords = "METIS-206912",
    author = "A.M. Bazen and Veldhuis, {Raymond N.J.}",
    note = "046N02",
    year = "2002",
    month = "11",
    day = "27",
    language = "Undefined",
    isbn = "90-73461-33-2",
    pages = "181--189",
    booktitle = "Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing",

    }

    Bazen, AM & Veldhuis, RNJ 2002, Likelihood Ratio-Based Biometric Verification. in Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing. Veldhoven, The Netherlands, pp. 181-189.

    Likelihood Ratio-Based Biometric Verification. / Bazen, A.M.; Veldhuis, Raymond N.J.

    Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing. Veldhoven, The Netherlands, 2002. p. 181-189.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Likelihood Ratio-Based Biometric Verification

    AU - Bazen, A.M.

    AU - Veldhuis, Raymond N.J.

    N1 - 046N02

    PY - 2002/11/27

    Y1 - 2002/11/27

    KW - METIS-206912

    M3 - Conference contribution

    SN - 90-73461-33-2

    SP - 181

    EP - 189

    BT - Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing

    CY - Veldhoven, The Netherlands

    ER -

    Bazen AM, Veldhuis RNJ. Likelihood Ratio-Based Biometric Verification. In Proceedings of the ProRISC workshop on Circuits, Systems and Signal Processing. Veldhoven, The Netherlands. 2002. p. 181-189