Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology

C.G. Bostan, R.M. de Ridder, V.J. Gadgil, L. Kuipers, A. Driessen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.
Original languageUndefined
Title of host publicationProceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting
Place of PublicationEnschede, Netherlands
PublisherIEEE/LEOS Benelux Chapter
Pages253-256
Number of pages4
ISBN (Print)90-365-1990-X
Publication statusPublished - 20 Nov 2003
Event8th Annual Symposium IEEE/LEOS Benelux Chapter 2003 - University of Twente, Enschede, Netherlands
Duration: 20 Nov 200321 Nov 2003
Conference number: 8

Publication series

Name
PublisherIEEE/LEOS Benelux Chapter

Conference

Conference8th Annual Symposium IEEE/LEOS Benelux Chapter 2003
CountryNetherlands
CityEnschede
Period20/11/0321/11/03

Keywords

  • IR-58170
  • METIS-216099

Cite this

Bostan, C. G., de Ridder, R. M., Gadgil, V. J., Kuipers, L., & Driessen, A. (2003). Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. In Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting (pp. 253-256). Enschede, Netherlands: IEEE/LEOS Benelux Chapter.
Bostan, C.G. ; de Ridder, R.M. ; Gadgil, V.J. ; Kuipers, L. ; Driessen, A. / Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. Enschede, Netherlands : IEEE/LEOS Benelux Chapter, 2003. pp. 253-256
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title = "Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology",
abstract = "Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.",
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year = "2003",
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Bostan, CG, de Ridder, RM, Gadgil, VJ, Kuipers, L & Driessen, A 2003, Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. in Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. IEEE/LEOS Benelux Chapter, Enschede, Netherlands, pp. 253-256, 8th Annual Symposium IEEE/LEOS Benelux Chapter 2003, Enschede, Netherlands, 20/11/03.

Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. / Bostan, C.G.; de Ridder, R.M.; Gadgil, V.J.; Kuipers, L.; Driessen, A.

Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. Enschede, Netherlands : IEEE/LEOS Benelux Chapter, 2003. p. 253-256.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology

AU - Bostan, C.G.

AU - de Ridder, R.M.

AU - Gadgil, V.J.

AU - Kuipers, L.

AU - Driessen, A.

PY - 2003/11/20

Y1 - 2003/11/20

N2 - Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.

AB - Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.

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BT - Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting

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Bostan CG, de Ridder RM, Gadgil VJ, Kuipers L, Driessen A. Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. In Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. Enschede, Netherlands: IEEE/LEOS Benelux Chapter. 2003. p. 253-256