Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology

C.G. Bostan; R.M. de Ridder; V.J. Gadgil; L. Kuipers; A. Driessen

Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology

C.G. Bostan, R.M. de Ridder, V.J. Gadgil, L. Kuipers, A. Driessen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.

Original language	Undefined
Title of host publication	Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting
Place of Publication	Enschede, Netherlands
Publisher	IEEE
Pages	253-256
Number of pages	4
ISBN (Print)	90-365-1990-X
Publication status	Published - 20 Nov 2003
Event	8th Annual Symposium IEEE/LEOS Benelux Chapter 2003 - University of Twente, Enschede, Netherlands Duration: 20 Nov 2003 → 21 Nov 2003 Conference number: 8

Publication series

Name
Publisher	IEEE/LEOS Benelux Chapter

Conference

Conference	8th Annual Symposium IEEE/LEOS Benelux Chapter 2003
Country/Territory	Netherlands
City	Enschede
Period	20/11/03 → 21/11/03

Keywords

IR-58170
METIS-216099

Access to Document

Bostan03line-defect

Cite this

@inproceedings{c6cc89bb80fb4b82ae935acc34b0b7fc,

title = "Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology",

abstract = "Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line {\textquoteleft}defects{\textquoteright} in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line {\textquoteleft}defect{\textquoteright} and conventional ridge waveguides.",

keywords = "IR-58170, METIS-216099",

author = "C.G. Bostan and {de Ridder}, R.M. and V.J. Gadgil and L. Kuipers and A. Driessen",

year = "2003",

month = nov,

day = "20",

language = "Undefined",

isbn = "90-365-1990-X",

publisher = "IEEE",

pages = "253--256",

booktitle = "Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting",

address = "United States",

note = "8th Annual Symposium IEEE/LEOS Benelux Chapter 2003 ; Conference date: 20-11-2003 Through 21-11-2003",

}

Bostan, CG, de Ridder, RM, Gadgil, VJ, Kuipers, L & Driessen, A 2003, Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. in Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. IEEE, Enschede, Netherlands, pp. 253-256, 8th Annual Symposium IEEE/LEOS Benelux Chapter 2003, Enschede, Netherlands, 20/11/03.

Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology. / Bostan, C.G.; de Ridder, R.M.; Gadgil, V.J. et al.
Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting. Enschede, Netherlands: IEEE, 2003. p. 253-256.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Line-Defect waveguides in hexagon-hole type photonic crystal slabs: design and fabrication using focused ion beam technology

AU - Bostan, C.G.

AU - de Ridder, R.M.

AU - Gadgil, V.J.

AU - Kuipers, L.

AU - Driessen, A.

N1 - Conference code: 8

PY - 2003/11/20

Y1 - 2003/11/20

N2 - Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.

AB - Photonic-crystal slabs (PCS) patterned with a 2D triangular-lattice having hexagonal holes rotated with respect to their symmetry axis can provide a larger bandgap than similar slabs with circular holes. A step forward towards integrated optical devices is introducing line ‘defects’ in PCS, the goal being the achievement of single-mode waveguiding over a frequency range as large as possible, inside the gap. We present the design for defect waveguides with reduced width and a novel fabrication technique, which is an integration of optical lithography with focused ion beam (FIB) high-resolution etching. This technique allows a good alignment between a line ‘defect’ and conventional ridge waveguides.

KW - IR-58170

KW - METIS-216099

M3 - Conference contribution

SN - 90-365-1990-X

SP - 253

EP - 256

BT - Proceedings symposium, IEEE/LEOS Benelux Chapter 2003 Meeting

PB - IEEE

CY - Enschede, Netherlands

T2 - 8th Annual Symposium IEEE/LEOS Benelux Chapter 2003

Y2 - 20 November 2003 through 21 November 2003

ER -