The work described in this thesis is aimed at the exploration of new methods for the integration of design and test development procedures for mixedsignal integrated circuits (IC's). Mixed-signal IC's are currently found in many electronic systems, including telecommunications, audio and video instruments, automotive parts, etc. The testing of these IC's presents problems due to the complex nature of analog functionality and the nonautomated analog design process. Automatic generation of test programs for analog parts is a problem which is not yet fully solved. Once a test is generated, formal methods to ensure the quality of developed tests do not exist or have a large overhead. Systematic links between design and test development processes of analog and mixed-signal circuits are required to improve these points and to ensure high quality and low time-to-market (TTM) for mixed-signal IC's.
|Award date||29 Sep 2000|
|Place of Publication||Enschede|
|Publication status||Published - 29 Sep 2000|