Abstract
The work described in this thesis is aimed at the exploration of new methods
for the integration of design and test development procedures for mixedsignal
integrated circuits (IC's). Mixed-signal IC's are currently found in
many electronic systems, including telecommunications, audio and video
instruments, automotive parts, etc. The testing of these IC's presents
problems due to the complex nature of analog functionality and the nonautomated
analog design process. Automatic generation of test programs
for analog parts is a problem which is not yet fully solved. Once a test is
generated, formal methods to ensure the quality of developed tests do not
exist or have a large overhead. Systematic links between design and test
development processes of analog and mixed-signal circuits are required to
improve these points and to ensure high quality and low time-to-market
(TTM) for mixed-signal IC's.
| Original language | English |
|---|---|
| Qualification | Doctor of Philosophy |
| Awarding Institution |
|
| Supervisors/Advisors |
|
| Award date | 29 Sept 2000 |
| Place of Publication | Enschede |
| Publisher | |
| Print ISBNs | 9036514940 |
| Publication status | Published - 29 Sept 2000 |
Keywords
- METIS-111476
- IR-14175