Abstract
We employ noise spectroscopy and transconductance measurements to establish the optimal regimes of operation for our fabricated silicon nanowire field-effect transistors (Si NW FETs) sensors. A strong coupling between the liquid gate and back gate (the substrate) has been revealed and used for optimization of signal-to-noise ratio in subthreshold as well as above-threshold regimes. Increasing the sensitivity of Si NW FET sensors above the detection limit has been predicted and proven by direct experimental measurements.
Original language | English |
---|---|
Pages (from-to) | 578-584 |
Number of pages | 7 |
Journal | Nano letters |
Volume | 14 |
Issue number | 2 |
DOIs | |
Publication status | Published - 12 Feb 2014 |
Externally published | Yes |
Keywords
- FET
- gate coupling
- liquid gate
- noise spectroscopy
- signal-to-noise ratio
- Silicon nanowires