Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun

X. Shang; Raymond N.J. Veldhuis

doi:10.1109/BTAS.2007.4401939

Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun

X. Shang, Raymond N.J. Veldhuis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

11 Citations (Scopus)

1 Downloads (Pure)

Abstract

In a biometric verification system of a smart gun, the rightful user is recognized based on his handpressure pattern. The main factor which affects the verification performance of this system is the variation between the probe image and the gallery image of a subject, in particular when the probe and the gallery images have been recorded with a few weeks in between. One of the major variations is in the pressure distribution of images. In this work, we propose a novel preprocessing technique, Local Absolute Binary Patterns, prior to grippattern classification. With respect to a certain pixel in an image, Local Absolute Binary Patterns processing quantifies how its neighboring pixels are fluctuating. It will be shown that this technique can both reduce the variation of pressure distribution, and extract information of the hand shape in the image. Therefore, a significant improvement of the verification result has been achieved.

Original language	Undefined
Title of host publication	IEEE conference on Biometrics: Theory, Applications and Systems
Editors	K.W. Bowyer, P.J. Flynn, V. Govindaraju, N. Ratha
Place of Publication	Los Alamitos, CA, USA
Publisher	University of Notre Dame
Pages	1-6
Number of pages	6
ISBN (Print)	978-1-4244-1597-7
DOIs	https://doi.org/10.1109/BTAS.2007.4401939
Publication status	Published - 29 Sept 2007
Event	First IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2007 - Washington, DC, USA Duration: 27 Sept 2007 → 29 Sept 2007

Publication series

Name
Publisher	IEEE
Number	Paper P-NS

Conference

Conference	First IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2007
Period	27/09/07 → 29/09/07
Other	27-29 September 2007

Keywords

SCS-Safety
METIS-245754
IR-61998
EWI-11334

Access to Document

10.1109/BTAS.2007.4401939

http://eprints.eemcs.utwente.nl/secure2/11334/01/ShangLABP210507.pdf

Cite this

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title = "Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun",

abstract = "In a biometric verification system of a smart gun, the rightful user is recognized based on his handpressure pattern. The main factor which affects the verification performance of this system is the variation between the probe image and the gallery image of a subject, in particular when the probe and the gallery images have been recorded with a few weeks in between. One of the major variations is in the pressure distribution of images. In this work, we propose a novel preprocessing technique, Local Absolute Binary Patterns, prior to grippattern classification. With respect to a certain pixel in an image, Local Absolute Binary Patterns processing quantifies how its neighboring pixels are fluctuating. It will be shown that this technique can both reduce the variation of pressure distribution, and extract information of the hand shape in the image. Therefore, a significant improvement of the verification result has been achieved.",

keywords = "SCS-Safety, METIS-245754, IR-61998, EWI-11334",

author = "X. Shang and Veldhuis, {Raymond N.J.}",

year = "2007",

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day = "29",

doi = "10.1109/BTAS.2007.4401939",

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publisher = "University of Notre Dame",

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editor = "K.W. Bowyer and P.J. Flynn and V. Govindaraju and N. Ratha",

booktitle = "IEEE conference on Biometrics: Theory, Applications and Systems",

address = "United States",

note = "First IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2007 ; Conference date: 27-09-2007 Through 29-09-2007",

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Shang, X & Veldhuis, RNJ 2007, Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun. in KW Bowyer, PJ Flynn, V Govindaraju & N Ratha (eds), IEEE conference on Biometrics: Theory, Applications and Systems. University of Notre Dame, Los Alamitos, CA, USA, pp. 1-6, First IEEE International Conference on Biometrics: Theory, Applications and Systems, BTAS 2007, 27/09/07. https://doi.org/10.1109/BTAS.2007.4401939

Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun. / Shang, X.; Veldhuis, Raymond N.J.
IEEE conference on Biometrics: Theory, Applications and Systems. ed. / K.W. Bowyer; P.J. Flynn; V. Govindaraju; N. Ratha. Los Alamitos, CA, USA: University of Notre Dame, 2007. p. 1-6.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - In a biometric verification system of a smart gun, the rightful user is recognized based on his handpressure pattern. The main factor which affects the verification performance of this system is the variation between the probe image and the gallery image of a subject, in particular when the probe and the gallery images have been recorded with a few weeks in between. One of the major variations is in the pressure distribution of images. In this work, we propose a novel preprocessing technique, Local Absolute Binary Patterns, prior to grippattern classification. With respect to a certain pixel in an image, Local Absolute Binary Patterns processing quantifies how its neighboring pixels are fluctuating. It will be shown that this technique can both reduce the variation of pressure distribution, and extract information of the hand shape in the image. Therefore, a significant improvement of the verification result has been achieved.

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