Localization of transverse waves in randomly layered media at oblique incidence

K.Yu. Bliokh, V.D. Freilikher

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We investigate the oblique incidence of electromagnetic waves on a randomly layered medium in the limit of strong disorder. An approximate method for calculating the inverse localization length based on the assumptions of zero-energy flux and complete phase stochastization is presented. Two effects not found at normal incidence have been studied: dependence of the localization length on the polarization and decrease of the localization length due to the internal reflections from layers with small refractive indexes. The inverse localization length (attenuation rate) for P-polarized radiation is shown to be always smaller than that of S waves, which is to say that long enough randomly layered sample polarizes transmitted radiation. The localization length for P polarization depends nonmonotonically on the angle of propagation and under certain conditions turns to infinity at some angle, which means that typical (nonresonant) random realizations become transparent at this angle of incidence (stochastic Brewster effect).
Original languageUndefined
Pages (from-to)245121
JournalPhysical review B: Condensed matter and materials physics
Issue number24
Publication statusPublished - 2004


  • IR-57512

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