Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking

S. Gnesi, Gabriele Lenzini, F. Martinelli

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    5 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India
    EditorsS. Etalle, S. Mukhopadhyay, A. Roychoudhury
    PublisherElsevier
    Pages57-70
    Publication statusPublished - 14 Dec 2005
    EventInternational Workshop on Software Verification and Validation: SVV 2003 - Mumbai, India
    Duration: 14 Dec 200314 Dec 2003

    Publication series

    Name
    Volume118
    ISSN (Print)1571-0661
    ISSN (Electronic)1571-0661

    Conference

    ConferenceInternational Workshop on Software Verification and Validation
    Abbreviated titleSVV 2003
    CountryIndia
    CityMumbai
    Period14/12/0314/12/03

    Keywords

    • METIS-214067

    Cite this

    Gnesi, S., Lenzini, G., & Martinelli, F. (2005). Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. In S. Etalle, S. Mukhopadhyay, & A. Roychoudhury (Eds.), Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India (pp. 57-70). Elsevier.
    Gnesi, S. ; Lenzini, Gabriele ; Martinelli, F. / Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. editor / S. Etalle ; S. Mukhopadhyay ; A. Roychoudhury. Elsevier, 2005. pp. 57-70
    @inproceedings{bdabb58ef87341f3956ae2a46ece8cb9,
    title = "Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking",
    keywords = "METIS-214067",
    author = "S. Gnesi and Gabriele Lenzini and F. Martinelli",
    year = "2005",
    month = "12",
    day = "14",
    language = "Undefined",
    publisher = "Elsevier",
    pages = "57--70",
    editor = "S. Etalle and S. Mukhopadhyay and A. Roychoudhury",
    booktitle = "Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India",

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    Gnesi, S, Lenzini, G & Martinelli, F 2005, Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. in S Etalle, S Mukhopadhyay & A Roychoudhury (eds), Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. Elsevier, pp. 57-70, International Workshop on Software Verification and Validation, Mumbai, India, 14/12/03.

    Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. / Gnesi, S.; Lenzini, Gabriele; Martinelli, F.

    Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. ed. / S. Etalle; S. Mukhopadhyay; A. Roychoudhury. Elsevier, 2005. p. 57-70.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking

    AU - Gnesi, S.

    AU - Lenzini, Gabriele

    AU - Martinelli, F.

    PY - 2005/12/14

    Y1 - 2005/12/14

    KW - METIS-214067

    M3 - Conference contribution

    SP - 57

    EP - 70

    BT - Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India

    A2 - Etalle, S.

    A2 - Mukhopadhyay, S.

    A2 - Roychoudhury, A.

    PB - Elsevier

    ER -

    Gnesi S, Lenzini G, Martinelli F. Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. In Etalle S, Mukhopadhyay S, Roychoudhury A, editors, Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. Elsevier. 2005. p. 57-70