Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking

S. Gnesi; Gabriele Lenzini; F. Martinelli

Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking

S. Gnesi, Gabriele Lenzini, F. Martinelli

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India
Editors	S. Etalle, S. Mukhopadhyay, A. Roychoudhury
Publisher	Elsevier
Pages	57-70
Publication status	Published - 14 Dec 2005
Event	International Workshop on Software Verification and Validation, SVV 2003 - Mumbai, India Duration: 14 Dec 2003 → 14 Dec 2003

Publication series

Name
Volume	118
ISSN (Print)	1571-0661
ISSN (Electronic)	1571-0661

Conference

Conference	International Workshop on Software Verification and Validation, SVV 2003
Abbreviated title	SVV
Country/Territory	India
City	Mumbai
Period	14/12/03 → 14/12/03

Keywords

METIS-214067

Cite this

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title = "Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking",

keywords = "METIS-214067",

author = "S. Gnesi and Gabriele Lenzini and F. Martinelli",

year = "2005",

month = dec,

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publisher = "Elsevier",

pages = "57--70",

editor = "S. Etalle and S. Mukhopadhyay and A. Roychoudhury",

booktitle = "Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India",

address = "Netherlands",

note = "International Workshop on Software Verification and Validation, SVV 2003 ; Conference date: 14-12-2003 Through 14-12-2003",

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Gnesi, S, Lenzini, G & Martinelli, F 2005, Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. in S Etalle, S Mukhopadhyay & A Roychoudhury (eds), Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. Elsevier, pp. 57-70, International Workshop on Software Verification and Validation, SVV 2003, Mumbai, India, 14/12/03.

Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking. / Gnesi, S.; Lenzini, Gabriele; Martinelli, F.
Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India. ed. / S. Etalle; S. Mukhopadhyay; A. Roychoudhury. Elsevier, 2005. p. 57-70.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Logical Characterization and Analysis of Fault Tolerant Systems through Partial Model Checking

AU - Gnesi, S.

AU - Lenzini, Gabriele

AU - Martinelli, F.

PY - 2005/12/14

Y1 - 2005/12/14

KW - METIS-214067

M3 - Conference contribution

SP - 57

EP - 70

BT - Proceedings of the International Workshop on Software Verification and Validation (SVV 2003), December 14 2003, Mumbai, India

A2 - Etalle, S.

A2 - Mukhopadhyay, S.

A2 - Roychoudhury, A.

PB - Elsevier

T2 - International Workshop on Software Verification and Validation, SVV 2003

Y2 - 14 December 2003 through 14 December 2003

ER -