Long range diffusion noise in platinum microwires with metallic adhesion layers

Z. Moktadir, J.W. van Honschoten, Michael Curt Elwenspoek

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    Abstract

    Voltage fluctuations of platinum wires hosted by silicon nitride beams were investigated. The authors considered four variants of the wires: three with an adhesion layer and one without an adhesion layer. They found that the presence of an adhesion layer changes the nature of the power spectrum which is 1f for wires with no adhesion layers and 1 f32 for wires with an adhesion layer. They attribute the value of the exponent α=32 found in wires with adhesion layers to the long range diffusion of oxygen atoms along the interface between the adhesion layer and the platinum layer.
    Original languageUndefined
    Article number10.1063/1.2746961
    Pages (from-to)233506
    Number of pages3
    JournalApplied physics letters
    Volume90
    Issue number23
    DOIs
    Publication statusPublished - 2007

    Keywords

    • IR-64733
    • METIS-247795
    • EWI-12315

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