Low Energy Ion Scattering from La surfaces

Andrey Zameshin; Andrey Yakshin; Marko Sturm; Hidde H. Brongersma; Fred Bijkerk

Low Energy Ion Scattering from La surfaces

Andrey Zameshin, Andrey Yakshin, Marko Sturm, Hidde H. Brongersma, Fred Bijkerk

XUV Optics

Research output: Contribution to conference › Poster › Other research output

Abstract

Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.

Original language	English
Number of pages	1
Publication status	Published - 19 Jan 2016
Event	Physics@FOM Veldhoven 2016 - NH Koningshof Veldhoven, Veldhoven, The Netherlands, Netherlands Duration: 20 Jan 2016 → 20 Jan 2016

Conference

Conference	Physics@FOM Veldhoven 2016
Abbreviated title	FOM
Country/Territory	Netherlands
City	Veldhoven, The Netherlands
Period	20/01/16 → 20/01/16

Cite this

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title = "Low Energy Ion Scattering from La surfaces",

abstract = "Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.",

author = "Andrey Zameshin and Andrey Yakshin and Marko Sturm and Brongersma, {Hidde H.} and Fred Bijkerk",

year = "2016",

month = jan,

day = "19",

language = "English",

note = "Physics@FOM Veldhoven 2016, FOM ; Conference date: 20-01-2016 Through 20-01-2016",

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TY - CONF

T1 - Low Energy Ion Scattering from La surfaces

AU - Zameshin, Andrey

AU - Yakshin, Andrey

AU - Sturm, Marko

AU - Brongersma, Hidde H.

AU - Bijkerk, Fred

PY - 2016/1/19

Y1 - 2016/1/19

N2 - Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.

AB - Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.

M3 - Poster

T2 - Physics@FOM Veldhoven 2016

Y2 - 20 January 2016 through 20 January 2016

ER -

Low Energy Ion Scattering from La surfaces

Abstract

Conference

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