Low Energy Ion Scattering from La surfaces

Research output: Contribution to conferencePosterOther research output

Abstract

Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.
Original languageEnglish
Pages-
Publication statusPublished - 19 Jan 2016
EventPhysics@FOM Veldhoven 2016 - NH Koningshof Veldhoven, Veldhoven, The Netherlands, Netherlands
Duration: 20 Jan 201620 Jan 2016

Conference

ConferencePhysics@FOM Veldhoven 2016
Abbreviated titleFOM
CountryNetherlands
CityVeldhoven, The Netherlands
Period20/01/1620/01/16

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ion scattering
energy
plotting
matrices
charge transfer
interactions
mirrors
sensitivity
wavelengths
atoms
ions

Cite this

Zameshin, A., Yakshin, A., Sturm, J. M., Brongersma, H. H., & Bijkerk, F. (2016). Low Energy Ion Scattering from La surfaces. -. Poster session presented at Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands.
Zameshin, Andrey ; Yakshin, Andrey ; Sturm, Jacobus Marinus ; Brongersma, H.H. ; Bijkerk, Frederik. / Low Energy Ion Scattering from La surfaces. Poster session presented at Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands.
@conference{24fe7793e5734c74843e7f1894c8bea3,
title = "Low Energy Ion Scattering from La surfaces",
abstract = "Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.",
author = "Andrey Zameshin and Andrey Yakshin and Sturm, {Jacobus Marinus} and H.H. Brongersma and Frederik Bijkerk",
year = "2016",
month = "1",
day = "19",
language = "English",
pages = "--",
note = "Physics@FOM Veldhoven 2016, FOM ; Conference date: 20-01-2016 Through 20-01-2016",

}

Zameshin, A, Yakshin, A, Sturm, JM, Brongersma, HH & Bijkerk, F 2016, 'Low Energy Ion Scattering from La surfaces' Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands, 20/01/16 - 20/01/16, pp. -.

Low Energy Ion Scattering from La surfaces. / Zameshin, Andrey; Yakshin, Andrey; Sturm, Jacobus Marinus; Brongersma, H.H.; Bijkerk, Frederik.

2016. - Poster session presented at Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands.

Research output: Contribution to conferencePosterOther research output

TY - CONF

T1 - Low Energy Ion Scattering from La surfaces

AU - Zameshin, Andrey

AU - Yakshin, Andrey

AU - Sturm, Jacobus Marinus

AU - Brongersma, H.H.

AU - Bijkerk, Frederik

PY - 2016/1/19

Y1 - 2016/1/19

N2 - Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.

AB - Low Energy Ion Scattering (LEIS) is a technique with ultimate sensitivity to only topmost atomic layer. We applied it together with XPS to studying the interaction of La and B layers at interfaces, which is crucial for improvement of properties of La/B-based multilayer mirrors for 6.7 nm wavelength light. Unusual drop of LEIS signal on La surface was observed, especially pronounced when interaction with O or B takes place. This behavior was found to be a rare matrix effect caused by low work functions of pure La as well as its compounds, which results in dominance of a resonant charge transfer mechanism, affecting LEIS signal. Since only La is present in the spectrum, matrix effect is formed by the sub-surface O and B atoms. Plotting normalized LEIS signal versus inversed velocity of the incident ions makes quantification of the surface composition possible.

M3 - Poster

SP - -

ER -

Zameshin A, Yakshin A, Sturm JM, Brongersma HH, Bijkerk F. Low Energy Ion Scattering from La surfaces. 2016. Poster session presented at Physics@FOM Veldhoven 2016, Veldhoven, The Netherlands, Netherlands.