Low-Tc ramp-type Josephson junctions for SQUIDS

M. Podt; B.G.A. Rolink; J. Flokstra; H. Rogalla

doi:10.1051/jp420020052

Low-T_c ramp-type Josephson junctions for SQUIDS

M. Podt, B.G.A. Rolink, J. Flokstra, H. Rogalla

Faculty of Science and Technology

Research output: Contribution to journal › Conference article › Academic

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Abstract

The Josephson tunnel junction is the basic element of a superconducting quantum interference device (SQUID). Amongst other parameters, the junction capacitance determines the characteristics of a (digital) SQUID. In a conventional dc SQUID, reducing the junction capacitance decreases the flux noise of the sensor, whereas in digital SQUIDs, the operating frequency can be increased when reducing the junction capacitance. For digital SQUIDs, this means that not only the flux noise decreases, but also the flux slew rate increases. Slew rates up to l0(8) @ds can be achieved by reducing the junction size to the sub-pm2 level. Using a ramp-type structure allows sub-pm2 Josephson junctions sizes using standard lithography. In this paper we present the first results on low-T, ramp-type Josephson junctions and dc SQUIDs based on these junctions. The first junctions and SQUIDs showed nonhysteretic behavior at 4.2 K caused by the A1 bottom layer in the design.

Original language	English
Pages (from-to)	133-136
Journal	Journal de physique IV
Volume	12
Issue number	3
DOIs	https://doi.org/10.1051/jp420020052
Publication status	Published - 2002
Event	5th European Workshop on Low Temperature Electronics, WOLTE 2002 - Grenoble, France Duration: 19 Jun 2002 → 21 Jun 2002 Conference number: 5

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title = "Low-Tc ramp-type Josephson junctions for SQUIDS",

abstract = "The Josephson tunnel junction is the basic element of a superconducting quantum interference device (SQUID). Amongst other parameters, the junction capacitance determines the characteristics of a (digital) SQUID. In a conventional dc SQUID, reducing the junction capacitance decreases the flux noise of the sensor, whereas in digital SQUIDs, the operating frequency can be increased when reducing the junction capacitance. For digital SQUIDs, this means that not only the flux noise decreases, but also the flux slew rate increases. Slew rates up to l0(8) @ds can be achieved by reducing the junction size to the sub-pm2 level. Using a ramp-type structure allows sub-pm2 Josephson junctions sizes using standard lithography. In this paper we present the first results on low-T, ramp-type Josephson junctions and dc SQUIDs based on these junctions. The first junctions and SQUIDs showed nonhysteretic behavior at 4.2 K caused by the A1 bottom layer in the design.",

author = "M. Podt and B.G.A. Rolink and J. Flokstra and H. Rogalla",

year = "2002",

doi = "10.1051/jp420020052",

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journal = "Journal de physique IV",

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T1 - Low-Tc ramp-type Josephson junctions for SQUIDS

AU - Podt, M.

AU - Rolink, B.G.A.

AU - Flokstra, J.

AU - Rogalla, H.

N1 - Conference code: 5

PY - 2002

Y1 - 2002

N2 - The Josephson tunnel junction is the basic element of a superconducting quantum interference device (SQUID). Amongst other parameters, the junction capacitance determines the characteristics of a (digital) SQUID. In a conventional dc SQUID, reducing the junction capacitance decreases the flux noise of the sensor, whereas in digital SQUIDs, the operating frequency can be increased when reducing the junction capacitance. For digital SQUIDs, this means that not only the flux noise decreases, but also the flux slew rate increases. Slew rates up to l0(8) @ds can be achieved by reducing the junction size to the sub-pm2 level. Using a ramp-type structure allows sub-pm2 Josephson junctions sizes using standard lithography. In this paper we present the first results on low-T, ramp-type Josephson junctions and dc SQUIDs based on these junctions. The first junctions and SQUIDs showed nonhysteretic behavior at 4.2 K caused by the A1 bottom layer in the design.

AB - The Josephson tunnel junction is the basic element of a superconducting quantum interference device (SQUID). Amongst other parameters, the junction capacitance determines the characteristics of a (digital) SQUID. In a conventional dc SQUID, reducing the junction capacitance decreases the flux noise of the sensor, whereas in digital SQUIDs, the operating frequency can be increased when reducing the junction capacitance. For digital SQUIDs, this means that not only the flux noise decreases, but also the flux slew rate increases. Slew rates up to l0(8) @ds can be achieved by reducing the junction size to the sub-pm2 level. Using a ramp-type structure allows sub-pm2 Josephson junctions sizes using standard lithography. In this paper we present the first results on low-T, ramp-type Josephson junctions and dc SQUIDs based on these junctions. The first junctions and SQUIDs showed nonhysteretic behavior at 4.2 K caused by the A1 bottom layer in the design.

U2 - 10.1051/jp420020052

DO - 10.1051/jp420020052

M3 - Conference article

SN - 1155-4339

VL - 12

SP - 133

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JO - Journal de physique IV

JF - Journal de physique IV

IS - 3

T2 - 5th European Workshop on Low Temperature Electronics, WOLTE 2002

Y2 - 19 June 2002 through 21 June 2002

ER -

Low-Tc ramp-type Josephson junctions for SQUIDS

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Low-T_c ramp-type Josephson junctions for SQUIDS