Magnetic behaviour of narrow track thin-film heads

W.F. Druyvesteyn; E.L.M. Raemaekers; R.D.J. Verhaar; J. de Wilde; J.H.J. Fluitman; J.P.J. Groenland

Magnetic behaviour of narrow track thin-film heads

W.F. Druyvesteyn, E.L.M. Raemaekers, R.D.J. Verhaar, J. de Wilde, J.H.J. Fluitman, J.P.J. Groenland

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Abstract

The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.

Original language	Undefined
Pages (from-to)	2462-2464
Number of pages	3
Journal	Journal of Applied Physics
Volume	52
Issue number	3
Publication status	Published - 1981

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-REC: RECORDING
IR-66089
EWI-5406

Access to Document

http://link.aip.org/link/doi/10.1063/1.328967

Cite this

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title = "Magnetic behaviour of narrow track thin-film heads",

abstract = "The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-REC: RECORDING, IR-66089, EWI-5406",

author = "W.F. Druyvesteyn and E.L.M. Raemaekers and R.D.J. Verhaar and {de Wilde}, J. and J.H.J. Fluitman and J.P.J. Groenland",

note = "Imported from SMI Reference manager",

year = "1981",

language = "Undefined",

volume = "52",

pages = "2462--2464",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Magnetic behaviour of narrow track thin-film heads

AU - Druyvesteyn, W.F.

AU - Raemaekers, E.L.M.

AU - Verhaar, R.D.J.

AU - de Wilde, J.

AU - Fluitman, J.H.J.

AU - Groenland, J.P.J.

N1 - Imported from SMI Reference manager

PY - 1981

Y1 - 1981

N2 - The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.

AB - The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-REC: RECORDING

KW - IR-66089

KW - EWI-5406

M3 - Article

VL - 52

SP - 2462

EP - 2464

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 3

ER -