Magnetic behaviour of narrow track thin-film heads

W.F. Druyvesteyn, E.L.M. Raemaekers, R.D.J. Verhaar, J. de Wilde, J.H.J. Fluitman, J.P.J. Groenland

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    The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.
    Original languageUndefined
    Pages (from-to)2462-2464
    Number of pages3
    JournalJournal of Applied Physics
    Issue number3
    Publication statusPublished - 1981


    • SMI-TST: From 2006 in EWI-TST
    • IR-66089
    • EWI-5406

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