The influence of the trackwidth on the performance of thin film heads has been tested. Results of experiments on the wafer have indicated an increase in the head efficiency with decreasing trackwidth. This was underlined by measurements of the head fringe field and tape recording experiments. A model which takes the domain structure into account has been developed to interpret this behaviour.
|Number of pages||3|
|Journal||Journal of Applied Physics|
|Publication status||Published - 1981|
- SMI-TST: From 2006 in EWI-TST
- SMI-REC: RECORDING