Magnetic characterization of large area arrays of single and multi domain CoNi/Pt multilayer dots

M.A.M. Haast, I.R. Heskamp, Leon Abelmann, J.C. Lodder, Th.J.A. Popma

    Research output: Contribution to journalArticleAcademicpeer-review

    16 Citations (Scopus)

    Abstract

    Co50Ni50/Pt multilayers with perpendicular magnetic anisotropy have been patterned into single and multi domain dots by laser interference lithography and ion beam etching. The samples (typically 1×1 cm2) have been characterized by VSM, polar Kerr Magnetometry, Torque Magnetometry and Magnetic Force Microscopy. The relation between coercivity, anisotropy and dot size is discussed. Also the rotational hysteresis loss of single and multi domain dots is reported.
    Original languageEnglish
    Pages (from-to)511-514
    Number of pages4
    JournalJournal of magnetism and magnetic materials
    Volume193
    Issue number1-3
    DOIs
    Publication statusPublished - 1999
    Event7th International Conference of Magnetic Recording Media, MRM 1998 - Maastricht, Netherlands
    Duration: 30 Aug 19982 Sep 1998
    Conference number: 7

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • TSTNE-Magnet-TMM: Torque Magnetometer
    • TSTNE-Probe-MFM: Magnetic Force Microscope
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • TSTNE-Magnet-VSM: Vibrating Sample Magnetometer
    • Discrete magnetic recording
    • Laser interference lithography
    • Magnetic multilayers

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