Magnetic force microscopy on thin film magnetic recording media

S. Porthun; M. Rührig; J.C. Lodder

doi:10.1007/978-94-011-0049-6_40

Magnetic force microscopy on thin film magnetic recording media

S. Porthun, M. Rührig, J.C. Lodder

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Abstract

In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.

This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.

Original language	English
Title of host publication	Forces in scanning probe microscopy
Editors	H.J. Güntherodt, D. Anselmetti, E. Meyer
Place of Publication	Dordrecht
Publisher	Kluwer Academic Publishers
Pages	471-476
Number of pages	6
ISBN (Electronic)	978-94-011-0049-6
ISBN (Print)	978-94-010-4027-3
DOIs	https://doi.org/10.1007/978-94-011-0049-6_40
Publication status	Published - 1995
Event	NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994 - Schluchsee, Germany Duration: 7 Mar 1994 → 18 Mar 1994

Publication series

Name	NATO ASI Series
Publisher	Kluwer Academic Publishers
Volume	286
ISSN (Print)	0168-132X

Conference

Conference	NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994
Country/Territory	Germany
City	Schluchsee
Period	7/03/94 → 18/03/94

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-EXP: EXPERIMENTAL TECHNIQUES
Tungsten wire
Force gradient
Magnetic force microscopy
Stray field

Access to Document

10.1007/978-94-011-0049-6_40

Porthun1995magneticFinal published version, 3.27 MB

Cite this

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title = "Magnetic force microscopy on thin film magnetic recording media",

abstract = "In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-EXP: EXPERIMENTAL TECHNIQUES, Tungsten wire, Force gradient, Magnetic force microscopy, Stray field",

author = "S. Porthun and M. R{\"u}hrig and J.C. Lodder",

year = "1995",

doi = "10.1007/978-94-011-0049-6_40",

language = "English",

isbn = "978-94-010-4027-3",

series = "NATO ASI Series",

publisher = "Kluwer Academic Publishers",

pages = "471--476",

editor = "H.J. G{\"u}ntherodt and D. Anselmetti and E. Meyer",

booktitle = "Forces in scanning probe microscopy",

address = "Netherlands",

note = "NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994 ; Conference date: 07-03-1994 Through 18-03-1994",

}

Porthun, S, Rührig, M & Lodder, JC 1995, Magnetic force microscopy on thin film magnetic recording media. in HJ Güntherodt, D Anselmetti & E Meyer (eds), Forces in scanning probe microscopy. NATO ASI Series, vol. 286, Kluwer Academic Publishers, Dordrecht, pp. 471-476, NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994, Schluchsee, Baden-Württemberg, Germany, 7/03/94. https://doi.org/10.1007/978-94-011-0049-6_40

TY - CHAP

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AU - Porthun, S.

AU - Rührig, M.

AU - Lodder, J.C.

PY - 1995

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N2 - In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.

AB - In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.

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KW - Force gradient

KW - Magnetic force microscopy

KW - Stray field

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