Magnetic force microscopy on thin film magnetic recording media

S. Porthun, M. Rührig, J.C. Lodder

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

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    In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.

    This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.
    Original languageEnglish
    Title of host publicationForces in scanning probe microscopy
    EditorsH.J. Güntherodt, D. Anselmetti, E. Meyer
    Place of PublicationDordrecht
    PublisherKluwer Academic Publishers
    Number of pages6
    ISBN (Electronic)978-94-011-0049-6
    ISBN (Print)978-94-010-4027-3
    Publication statusPublished - 1995
    EventNATO Advanced Study Institute on Forces in Scanning Probe Methods 1994 - Schluchsee, Germany
    Duration: 7 Mar 199418 Mar 1994

    Publication series

    NameNATO ASI Series
    PublisherKluwer Academic Publishers
    ISSN (Print)0168-132X


    ConferenceNATO Advanced Study Institute on Forces in Scanning Probe Methods 1994


    • SMI-TST: From 2006 in EWI-TST
    • Tungsten wire
    • Force gradient
    • Magnetic force microscopy
    • Stray field


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