Abstract
In order to understand the magnetic behaviour of thin film magnetic recording media high resolution magnetic observation techniques are very essential to see magnetic details smaller than 100 ran size. Magnetic Force Microscopy (MFM) is used for analysing thin magnetic films and multilayers as well as for investigation of written bits in high density recording media. Continuous attention is given to increase the performance of the used magnetic tips.
This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.
This presentation briefly shows the basic measurement principle used in our set-up. An overview will be given about the results obtained from magneto-optically recorded bits as well as bits on Co-Cr-Ta/Ni-Fe perpendicular hard disk media. In the latter small tracks of 200 kFRPI (kilo flux reversals per inch) will be shown. Furthermore we present domain structure observations on Co/Pd multilayer materials used for MO application. Domains of 70 nm size have been observed here.
Original language | English |
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Title of host publication | Forces in scanning probe microscopy |
Editors | H.J. Güntherodt, D. Anselmetti, E. Meyer |
Place of Publication | Dordrecht |
Publisher | Kluwer Academic Publishers |
Pages | 471-476 |
Number of pages | 6 |
ISBN (Electronic) | 978-94-011-0049-6 |
ISBN (Print) | 978-94-010-4027-3 |
DOIs | |
Publication status | Published - 1995 |
Event | NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994 - Schluchsee, Germany Duration: 7 Mar 1994 → 18 Mar 1994 |
Publication series
Name | NATO ASI Series |
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Publisher | Kluwer Academic Publishers |
Volume | 286 |
ISSN (Print) | 0168-132X |
Conference
Conference | NATO Advanced Study Institute on Forces in Scanning Probe Methods 1994 |
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Country/Territory | Germany |
City | Schluchsee |
Period | 7/03/94 → 18/03/94 |
Keywords
- SMI-TST: From 2006 in EWI-TST
- SMI-EXP: EXPERIMENTAL TECHNIQUES
- Tungsten wire
- Force gradient
- Magnetic force microscopy
- Stray field