Magnetic Force Microscopy - Towards higher resolution

Leon Abelmann, A.G. van den Bos, J.C. Lodder

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    Abstract

    In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution and the design and realisation of MFM tips.
    Original languageUndefined
    Title of host publicationMagnetic Microscopy of Nanostructures
    EditorsH. Hopster, H.P. Oepen
    Place of PublicationBerlin
    PublisherSpringer
    Pages253-283
    Number of pages31
    ISBN (Print)3-540-40186-5
    DOIs
    Publication statusPublished - 2005

    Publication series

    NameNanoScience and Technology
    PublisherSpringer Verlag
    NumberChapter 12
    ISSN (Print)1533-4880
    ISSN (Electronic)1533-4899

    Keywords

    • METIS-212069
    • IR-66340
    • EWI-6875
    • TST-uSPAM: micro Scanning Probe Array Memory
    • TSTNE-Probe-MFM: Magnetic Force Microscope
    • SMI-TST: From 2006 in EWI-TST
    • TST-MFM: Magnetic Force Microscope
    • SMI-EXP: EXPERIMENTAL TECHNIQUES

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