Magnetic Microstructure of Sputtered Co-Cr Films

P. ten Berge, P. ten Berge, J.C. Lodder, R. Plößl, J.N. Chapmann

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    Abstract

    The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.
    Original languageUndefined
    Pages (from-to)362-365
    Number of pages5
    JournalJournal of magnetism and magnetic materials
    Volume120
    Issue number120
    DOIs
    Publication statusPublished - 1993

    Keywords

    • METIS-129078
    • EWI-5381
    • SMI-MAT: MATERIALS
    • SMI-TST: From 2006 in EWI-TST
    • IR-24278

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