Magnetic Microstructure of Sputtered Co-Cr Films

P. ten Berge; J.C. Lodder; R. Plößl; J.N. Chapmann

doi:10.1016/0304-8853(93)91362-B

Magnetic Microstructure of Sputtered Co-Cr Films

P. ten Berge, J.C. Lodder, R. Plößl, J.N. Chapmann

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

158 Downloads (Pure)

Abstract

The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.

Original language	English
Pages (from-to)	362-365
Number of pages	5
Journal	Journal of magnetism and magnetic materials
Volume	120
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-8853(93)91362-B
Publication status	Published - 1993
Event	5th International Conference on Magnetic Recording Media, MRM 1992 - Perugia, Italy Duration: 2 Sept 1992 → 4 Sept 1992 Conference number: 5

Keywords

SMI-MAT: MATERIALS
SMI-TST: From 2006 in EWI-TST

Access to Document

10.1016/0304-8853(93)91362-B

Berge93magneticFinal published version, 369 KB

2 Citations
1 Poster

Magnetic microstructure of sputtered Co-Cr films
ten Berge, P., Lodder, J. C., Plößl, R. & Chapmann, J. N., 1992. 1 p.
Research output: Contribution to conference › Poster › Other research output

Cite this

@article{a0d1eae7a7904274bd17de9d88cb320b,

title = "Magnetic Microstructure of Sputtered Co-Cr Films",

abstract = "The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.",

keywords = "SMI-MAT: MATERIALS, SMI-TST: From 2006 in EWI-TST",

author = "{ten Berge}, P. and J.C. Lodder and R. Pl{\"o}{\ss}l and J.N. Chapmann",

year = "1993",

doi = "10.1016/0304-8853(93)91362-B",

language = "English",

volume = "120",

pages = "362--365",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier B.V.",

number = "1-3",

note = "5th International Conference on Magnetic Recording Media, MRM 1992, MRM ; Conference date: 02-09-1992 Through 04-09-1992",

}

TY - JOUR

T1 - Magnetic Microstructure of Sputtered Co-Cr Films

AU - ten Berge, P.

AU - Lodder, J.C.

AU - Plößl, R.

AU - Chapmann, J.N.

N1 - Conference code: 5

PY - 1993

Y1 - 1993

N2 - The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.

AB - The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-rie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.

KW - SMI-MAT: MATERIALS

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1016/0304-8853(93)91362-B

DO - 10.1016/0304-8853(93)91362-B

M3 - Article

SN - 0304-8853

VL - 120

SP - 362

EP - 365

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

IS - 1-3

T2 - 5th International Conference on Magnetic Recording Media, MRM 1992

Y2 - 2 September 1992 through 4 September 1992

ER -

Magnetic Microstructure of Sputtered Co-Cr Films

Abstract

Keywords

Access to Document

Fingerprint

Research output

Magnetic microstructure of sputtered Co-Cr films

Cite this