Magnetic Scanning Probe Microscope Sensors Modified by Focussed on Ion Beam Milling

G.N. Phillips, Martin Herman Siekman, Leon Abelmann, J.C. Lodder

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationTU Delft, The Netherlands
    Publication statusPublished - 3 Nov 2000

    Keywords

    • METIS-115087

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