Magnetic stray fields of Co‐Cr microstrips measured by Lorentz microscopy

J.G.Th. te Lintelo; J.C. Lodder; S. McVitie; J.N. Chapman

doi:10.1063/1.356166

Magnetic stray fields of Co‐Cr microstrips measured by Lorentz microscopy

J.G.Th. te Lintelo, J.C. Lodder, S. McVitie, J.N. Chapman

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Abstract

Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.

Original language	English
Pages (from-to)	3002-3007
Number of pages	6
Journal	Journal of Applied Physics
Volume	75
Issue number	6
DOIs	https://doi.org/10.1063/1.356166
Publication status	Published - 1994

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS

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TeLintelo1994magneticFinal published version, 841 KB

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title = "Magnetic stray fields of Co‐Cr microstrips measured by Lorentz microscopy",

abstract = "Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",

author = "{te Lintelo}, J.G.Th. and J.C. Lodder and S. McVitie and J.N. Chapman",

year = "1994",

doi = "10.1063/1.356166",

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issn = "0021-8979",

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AU - te Lintelo, J.G.Th.

AU - Lodder, J.C.

AU - McVitie, S.

AU - Chapman, J.N.

PY - 1994

Y1 - 1994

N2 - Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.

AB - Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1063/1.356166

DO - 10.1063/1.356166

M3 - Article

VL - 75

SP - 3002

EP - 3007

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 6

ER -

Magnetic stray fields of Co‐Cr microstrips measured by Lorentz microscopy

Abstract

Keywords

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