Abstract
Unambiguous proof of spin transport in semiconductor spintronic devices requires a control
experiment to exclude spurious signals that arise from the presence of the ferromagnetic contacts.
It is shown here that insertion of a low-work-function Yb nanolayer in ferromagnetic tunnel contacts
to silicon allows a selective suppression of the tunnel spin polarization for 2 nm of Yb and
simultaneous control of the Schottky barrier height. The insertion of a nonmagnetic nanolayer
provides a versatile method to exclude artifacts and a solution for nanoscale devices or other
geometries in which the frequently employed Hanle effect cannot be applied and a control
experiment did not exist.
Original language | Undefined |
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Article number | 10.1063/1.3159638 |
Pages (from-to) | 016107 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 106 |
Issue number | 1 |
DOIs | |
Publication status | Published - 10 Jul 2009 |
Keywords
- EWI-16459
- IR-69037
- METIS-264434