Abstract
In this paper we report upon a study of the magnetization reversal
mechanisms in Co/Pt thin films at elevated temperatures. An alternating
gradient force magnetometer has been modified in order to perform
measurements at elevated temperatures. The data obtained from hysteresis
loops and remanence curves measured at high temperature has been used to
analyse reversal mechanisms which are discussed in terms of a well
established two-coercivity model. The high sensitivity of the magnetic
measurements reveal subtle temperature dependent changes in the magnetic
characteristics of the films, which are attributed to thermally induced
modifications of the energy barriers to magnetization reversal and film
microstructure. The evolution of domain structure during reversal has been
examined by magnetic force microscopy for a sample placed in varying
remanent states at elevated temperatures and is found to correlate with the
two-coercivity model. Additionally, a method by which samples may be
demagnetized in situ at elevated temperatures is discussed along with
domain wall motion induced by the stray field from magnetic force
microscope tips.
Original language | Undefined |
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Pages (from-to) | 2960-2971 |
Number of pages | 12 |
Journal | Journal of physics D: applied physics |
Volume | 34 |
Issue number | 19 |
DOIs | |
Publication status | Published - 2001 |
Keywords
- METIS-200608
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS
- EWI-5614
- IR-63026