Magnetoresistance and magnetic properties of annealed NiFeN thin films

B. Elm rabat, B. Elmrabat, T.J.A. Popma

Research output: Contribution to journalArticleAcademicpeer-review

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As-sputtered and annealed NiFe thin films were investigated by transmission electron microscopy (TEM), and Auger electron spectroscopy (AES). Their magnetoresistive and magnetic properties were characterized. It was found that both the microstructure and the physical properties of NiFe are affected by nitrogen addition in as-sputtered and annealed films. The out-diffusion of nitrogen during annealing strongly affects these properties and both the magnetoresistance and magnetic properties depend on the initial nitrogen content of the film.
Original languageEnglish
Pages (from-to)114-122
Number of pages9
JournalJournal of magnetism and magnetic materials
Issue number1-2
Publication statusPublished - 1990


  • METIS-112094
  • IR-72882


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