As-sputtered and annealed NiFe thin films were investigated by transmission electron microscopy (TEM), and Auger electron spectroscopy (AES). Their magnetoresistive and magnetic properties were characterized. It was found that both the microstructure and the physical properties of NiFe are affected by nitrogen addition in as-sputtered and annealed films. The out-diffusion of nitrogen during annealing strongly affects these properties and both the magnetoresistance and magnetic properties depend on the initial nitrogen content of the film.
|Number of pages||9|
|Journal||Journal of magnetism and magnetic materials|
|Publication status||Published - 1990|