Manganese ferrite thin films - Part II: Properties

W.S. Hulscher

doi:10.1016/0040-6090(72)90127-7

Manganese ferrite thin films - Part II: Properties

W.S. Hulscher

Faculty of Electrical Engineering, Mathematics and Computer Science

Research output: Contribution to journal › Article › Academic

3 Citations (Scopus)

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Abstract

Some properties of evaporated manganese ferrite thin films are investigated, e.g. resistivity, magnetization reversal, Curie temperature, Faraday rotation and optical absorption. The properties are partly related to the partial oxygen pressure present during a preceding annealing process.

Original language	English
Pages (from-to)	377-388
Journal	Thin solid films
Volume	9
Issue number	3
DOIs	https://doi.org/10.1016/0040-6090(72)90127-7
Publication status	Published - 1972

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@article{7dd27c29e807436d9e94cbf2cc8cfa34,

title = "Manganese ferrite thin films - Part II: Properties",

abstract = "Some properties of evaporated manganese ferrite thin films are investigated, e.g. resistivity, magnetization reversal, Curie temperature, Faraday rotation and optical absorption. The properties are partly related to the partial oxygen pressure present during a preceding annealing process.",

author = "W.S. Hulscher",

year = "1972",

doi = "10.1016/0040-6090(72)90127-7",

language = "English",

volume = "9",

pages = "377--388",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "3",

}

TY - JOUR

T1 - Manganese ferrite thin films - Part II: Properties

AU - Hulscher, W.S.

PY - 1972

Y1 - 1972

N2 - Some properties of evaporated manganese ferrite thin films are investigated, e.g. resistivity, magnetization reversal, Curie temperature, Faraday rotation and optical absorption. The properties are partly related to the partial oxygen pressure present during a preceding annealing process.

AB - Some properties of evaporated manganese ferrite thin films are investigated, e.g. resistivity, magnetization reversal, Curie temperature, Faraday rotation and optical absorption. The properties are partly related to the partial oxygen pressure present during a preceding annealing process.

U2 - 10.1016/0040-6090(72)90127-7

DO - 10.1016/0040-6090(72)90127-7

M3 - Article

SN - 0040-6090

VL - 9

SP - 377

EP - 388

JO - Thin solid films

JF - Thin solid films

IS - 3

ER -

Manganese ferrite thin films - Part II: Properties

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