Manipulating Electronic States at Oxide Interfaces Using Focused Micro X-Rays from Standard Lab Sources

Nicola Poccia*, Alessandro Ricci, F. Coneri, Martin Stehno, Gaetano Campi, Nicola Demitri, Giorgio Bais, X. Renshaw Wang, H. Hilgenkamp

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Abstract

Recently, X-ray illumination, using synchrotron radiation, has been used to manipulate defects, stimulate self-organization, and to probe their structure. Here, we explore a method of defect-engineering low-dimensional systems using focused laboratory-scale X-ray sources. We demonstrate an irreversible change in the conducting properties of the two-dimensional electron gas at the interface between the complex oxide materials LaAlO 3 and SrTiO 3 by X-ray irradiation. The electrical resistance is monitored during exposure as the irradiated regions are driven into a high-resistance state. Our results suggest attention shall be paid on electronic structure modification in X-ray spectroscopic studies and highlight large-area defect manipulation and direct device patterning as possible new fields of application for focused laboratory X-ray sources.

Original languageEnglish
Pages (from-to)1267-1272
Number of pages6
JournalJournal of superconductivity and novel magnetism
Volume28
Issue number4
DOIs
Publication statusPublished - 1 Apr 2015

Fingerprint

Electronic states
Oxides
X rays
oxides
electronics
Defects
X ray laboratories
x rays
defects
Acoustic impedance
Two dimensional electron gas
Synchrotron radiation
Electronic structure
high resistance
electrical resistance
Lighting
Irradiation
electron gas
manipulators
synchrotron radiation

Keywords

  • Focused X-ray
  • Functional oxides
  • Quasi-twodimensional electron gas
  • Resistive switching

Cite this

Poccia, Nicola ; Ricci, Alessandro ; Coneri, F. ; Stehno, Martin ; Campi, Gaetano ; Demitri, Nicola ; Bais, Giorgio ; Wang, X. Renshaw ; Hilgenkamp, H. / Manipulating Electronic States at Oxide Interfaces Using Focused Micro X-Rays from Standard Lab Sources. In: Journal of superconductivity and novel magnetism. 2015 ; Vol. 28, No. 4. pp. 1267-1272.
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Manipulating Electronic States at Oxide Interfaces Using Focused Micro X-Rays from Standard Lab Sources. / Poccia, Nicola; Ricci, Alessandro; Coneri, F.; Stehno, Martin; Campi, Gaetano; Demitri, Nicola; Bais, Giorgio; Wang, X. Renshaw; Hilgenkamp, H.

In: Journal of superconductivity and novel magnetism, Vol. 28, No. 4, 01.04.2015, p. 1267-1272.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Poccia, Nicola

AU - Ricci, Alessandro

AU - Coneri, F.

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AU - Campi, Gaetano

AU - Demitri, Nicola

AU - Bais, Giorgio

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