Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid

S.J.T. van Noort, O.H. Willemsen, Kees van der Werf, B.G. de Grooth, Jan Greve

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)7101-7107
    Number of pages7
    JournalLangmuir
    Volume21
    Publication statusPublished - 1999

    Keywords

    • METIS-128428

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