Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal

T. Denis, B. Reijnders, J.H.H. Lee, Willem L. Vos, Klaus J. Boller, Petrus J.M. van der Slot

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

We present a method to map the absolute electromagnetic field strength inside photonic crystals. We demonstrate our method by applying it to map the electric field component Ez of a two-dimensional photonic crystal slab at microwave frequencies. The slab is placed between two mirrors to create a resonator and a subwavelength spherical scatterer is scanned inside the resonator. The resonant Bloch frequencies shift depending on the electric field at the scatterer position. By measuring the frequency shift in the reflection and transmission spectrum versus the scatterer position we determine the field strength. Excellent agreement is found between measurements and calculations without any adjustable parameters and a possible realization is suggested for measurements at optical frequencies.
Original languageEnglish
Title of host publicationPhotonics West (OPTO) Photonic and Phononic Properties of Engineered Nanostructures III
Place of PublicationSan Francisco, USA
PublisherSPIE
Pages-
ISBN (Print)9780819494016
DOIs
Publication statusPublished - 2 Feb 2013
EventSPIE Photonics West 2013 - The Moscone Center, San Francisco, United States
Duration: 2 Feb 20137 Feb 2013

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume8632

Conference

ConferenceSPIE Photonics West 2013
CountryUnited States
CitySan Francisco
Period2/02/137/02/13
Other02-02-2013 - 07-02-2013

Keywords

  • METIS-293448
  • IR-89892

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    Denis, T., Reijnders, B., Lee, J. H. H., Vos, W. L., Boller, K. J., & van der Slot, P. J. M. (2013). Mapping the absolute electromagnetic field strength of individual field components inside a photonic crystal. In Photonics West (OPTO) Photonic and Phononic Properties of Engineered Nanostructures III (pp. -). (Proceedings of SPIE; Vol. 8632). San Francisco, USA: SPIE. https://doi.org/10.1117/12.2002945