Markov models of fault-tolerant memory systems under SEU

Luca Schiano, Marco Ottavi, Fabrizio Lombardi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

19 Citations (Scopus)
Original languageEnglish
Title of host publicationRecords of the IEEE International Workshop on Memory Technology, Design and Testing
EditorsTom Wilk, Adit Singh, Rochit Rajsuman
PublisherIEEE
ISBN (Print)0-7695-2193-2
DOIs
Publication statusPublished - 30 Aug 2004
Externally publishedYes
Event2004 International Workshop on Memory Technology, Design and Testing - San Jose, United States
Duration: 9 Aug 200410 Aug 2004

Publication series

Name
ISSN (Print)1087-4852

Workshop

Workshop2004 International Workshop on Memory Technology, Design and Testing
Abbreviated titleMTDT 2004
Country/TerritoryUnited States
CitySan Jose
Period9/08/0410/08/04

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