Material characterization method

Fernandez Rivas David (Inventor), Angel Quetzeri Santiago Miguel (Inventor)

Research output: Patent

Abstract

The invention provides a method for determining a property of a target area (15) of a material (10), wherein the target area (15) has a size selected from the range of 100 um2 — 100 mmz, wherein the method comprises: an exposure stage comprising providing a liquid jet (20) to the target area (15), Wherein the liquid jet (20) has a jet velocity selected from the range of 2 — 150 m/s; a measurement stage comprising detecting a deformation (16) of the material 10 in the target area (15) and providing a related signal; and an analysis stage comprising determining the property of the target area (15) based on the related signal.

Original languageEnglish
Patent numberNL2030901B
IPCA61M 5/ 30 A I
Priority date11/02/22
Publication statusPublished - 18 Aug 2023

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