Material characterization method

Fernandez Rivas David; Angel Quetzeri Santiago Miguel

Material characterization method

Fernandez Rivas David (Inventor)
, Angel Quetzeri Santiago Miguel (Inventor)

Research output: Patent

Abstract

The invention provides a method for determining a property of a target area (15) of a material (10), wherein the target area (15) has a size selected from the range of 100 um2 — 100 mmz, wherein the method comprises: an exposure stage comprising providing a liquid jet (20) to the target area (15), Wherein the liquid jet (20) has a jet velocity selected from the range of 2 — 150 m/s; a measurement stage comprising detecting a deformation (16) of the material 10 in the target area (15) and providing a related signal; and an analysis stage comprising determining the property of the target area (15) based on the related signal.

Original language	English
Patent number	NL2030901B
IPC	A61M 5/ 30 A I
Priority date	11/02/22
Publication status	Published - 18 Aug 2023

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title = "Material characterization method",

abstract = "The invention provides a method for determining a property of a target area (15) of a material (10), wherein the target area (15) has a size selected from the range of 100 um2 {\textemdash} 100 mmz, wherein the method comprises: an exposure stage comprising providing a liquid jet (20) to the target area (15), Wherein the liquid jet (20) has a jet velocity selected from the range of 2 {\textemdash} 150 m/s; a measurement stage comprising detecting a deformation (16) of the material 10 in the target area (15) and providing a related signal; and an analysis stage comprising determining the property of the target area (15) based on the related signal.",

author = "David, \{Fernandez Rivas\} and Miguel, \{Angel Quetzeri Santiago\}",

year = "2023",

month = aug,

day = "18",

language = "English",

type = "Patent",

note = "NL2030901B; A61M 5/ 30 A I",

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TY - PAT

T1 - Material characterization method

AU - David, Fernandez Rivas

AU - Miguel, Angel Quetzeri Santiago

PY - 2023/8/18

Y1 - 2023/8/18

N2 - The invention provides a method for determining a property of a target area (15) of a material (10), wherein the target area (15) has a size selected from the range of 100 um2 — 100 mmz, wherein the method comprises: an exposure stage comprising providing a liquid jet (20) to the target area (15), Wherein the liquid jet (20) has a jet velocity selected from the range of 2 — 150 m/s; a measurement stage comprising detecting a deformation (16) of the material 10 in the target area (15) and providing a related signal; and an analysis stage comprising determining the property of the target area (15) based on the related signal.

AB - The invention provides a method for determining a property of a target area (15) of a material (10), wherein the target area (15) has a size selected from the range of 100 um2 — 100 mmz, wherein the method comprises: an exposure stage comprising providing a liquid jet (20) to the target area (15), Wherein the liquid jet (20) has a jet velocity selected from the range of 2 — 150 m/s; a measurement stage comprising detecting a deformation (16) of the material 10 in the target area (15) and providing a related signal; and an analysis stage comprising determining the property of the target area (15) based on the related signal.

M3 - Patent

M1 - NL2030901B

ER -

Material characterization method

Abstract

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