Abstract
A study is presented on silicon oxynitride material for waveguides and germanium-silicon alloys for p-i-n diodes. The materials are manufactured at low, CMOS-backend compatible temperatures, targeting the integration of optical functions on top of CMOS chips. Low-temperature germanium-silicon deposition, crystallization and doping are studied for integrated photodetection up to ~1500 nm wavelength. An inductivelycoupled-plasma chemical vapor deposition process is presented for silicon oxynitride manufacturing at 150 °C wafer temperature, yielding low-loss material in a wide optical spectral range. Integration schemes for an optical plane on top of CMOS are discussed.
Original language | Undefined |
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Title of host publication | 15th International Conference on Ultimate Integration on Silicon, ULIS 2014 |
Place of Publication | USA |
Publisher | IEEE |
Pages | 153-156 |
Number of pages | 4 |
ISBN (Print) | 978-1-4799-3718-9 |
DOIs | |
Publication status | Published - 7 Apr 2014 |
Event | 15th International Conference on Ultimate Integration on Silicon, ULIS 2014 - Stockholm, Sweden Duration: 7 Apr 2014 → 9 Apr 2014 Conference number: 15th |
Publication series
Name | |
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Publisher | IEEE Circuits & Systems Society |
Conference
Conference | 15th International Conference on Ultimate Integration on Silicon, ULIS 2014 |
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Abbreviated title | ULIS 2014 |
Country/Territory | Sweden |
City | Stockholm |
Period | 7/04/14 → 9/04/14 |
Keywords
- EWI-25024
- METIS-306009
- thermal budget
- germanium-silicon
- silicon-germanium
- process integration
- Integrated Optics
- Integrated circuit fabrication
- Micro-fabrication
- MEMS
- SiON
- Waveguides
- WDMA
- PECVD
- Photodetectors
- Post processing
- IR-91695
- CMOS
- Above IC
- temperature budget