Materials Characterization of CIGS solar cells on Top of CMOS chips

J. Lu, W. Liu, A.Y. Kovalgin, Y. Sun, J. Schmitz

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

In the current work, we present a detailed study on the material properties of the CIGS layers, fabricated on top of the CMOS chips, and compare the results with the fabrication on standard glass substrates. Almost identical elemental composition on both glass and CMOS chips (within measurement error). From X-ray diffraction measurement, except two peaks from the Si <100> substrate, the diffraction peaks from CIGS solar cell CMOS chip and that on glass substrate coincide for all three temperatures. Helium ion microscope images of the cross-section and top view of the CIGS layers, shows that the grain size is suitable for high efficiency solar cells.
Original languageEnglish
Title of host publicationProceedings of 2011 MRS Spring Meeting
EditorsR. Venkatasubramanian, H. Radousky, H. Liang
Place of PublicationCambridge, UK
PublisherCambridge University Press
Pagese06-23
Number of pages8
DOIs
Publication statusPublished - 1 Jun 2011
EventMRS Spring Meeting 2011 - San Francisco, United States
Duration: 25 Apr 201129 Apr 2011

Publication series

NameMRS proceedings
PublisherCambridge University Press
Volume1325

Conference

ConferenceMRS Spring Meeting 2011
CountryUnited States
CitySan Francisco
Period25/04/1129/04/11

Fingerprint

CMOS
solar cells
chips
glass
ion microscopes
helium ions
diffraction
grain size
fabrication
cross sections
x rays
temperature

Keywords

  • IR-79892
  • EWI-21622
  • METIS-285166

Cite this

Lu, J., Liu, W., Kovalgin, A. Y., Sun, Y., & Schmitz, J. (2011). Materials Characterization of CIGS solar cells on Top of CMOS chips. In R. Venkatasubramanian, H. Radousky, & H. Liang (Eds.), Proceedings of 2011 MRS Spring Meeting (pp. e06-23). (MRS proceedings; Vol. 1325). Cambridge, UK: Cambridge University Press. https://doi.org/10.1557/opl.2011.1161
Lu, J. ; Liu, W. ; Kovalgin, A.Y. ; Sun, Y. ; Schmitz, J. / Materials Characterization of CIGS solar cells on Top of CMOS chips. Proceedings of 2011 MRS Spring Meeting. editor / R. Venkatasubramanian ; H. Radousky ; H. Liang. Cambridge, UK : Cambridge University Press, 2011. pp. e06-23 (MRS proceedings).
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abstract = "In the current work, we present a detailed study on the material properties of the CIGS layers, fabricated on top of the CMOS chips, and compare the results with the fabrication on standard glass substrates. Almost identical elemental composition on both glass and CMOS chips (within measurement error). From X-ray diffraction measurement, except two peaks from the Si <100> substrate, the diffraction peaks from CIGS solar cell CMOS chip and that on glass substrate coincide for all three temperatures. Helium ion microscope images of the cross-section and top view of the CIGS layers, shows that the grain size is suitable for high efficiency solar cells.",
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Lu, J, Liu, W, Kovalgin, AY, Sun, Y & Schmitz, J 2011, Materials Characterization of CIGS solar cells on Top of CMOS chips. in R Venkatasubramanian, H Radousky & H Liang (eds), Proceedings of 2011 MRS Spring Meeting. MRS proceedings, vol. 1325, Cambridge University Press, Cambridge, UK, pp. e06-23, MRS Spring Meeting 2011, San Francisco, United States, 25/04/11. https://doi.org/10.1557/opl.2011.1161

Materials Characterization of CIGS solar cells on Top of CMOS chips. / Lu, J.; Liu, W.; Kovalgin, A.Y.; Sun, Y.; Schmitz, J.

Proceedings of 2011 MRS Spring Meeting. ed. / R. Venkatasubramanian; H. Radousky; H. Liang. Cambridge, UK : Cambridge University Press, 2011. p. e06-23 (MRS proceedings; Vol. 1325).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Lu J, Liu W, Kovalgin AY, Sun Y, Schmitz J. Materials Characterization of CIGS solar cells on Top of CMOS chips. In Venkatasubramanian R, Radousky H, Liang H, editors, Proceedings of 2011 MRS Spring Meeting. Cambridge, UK: Cambridge University Press. 2011. p. e06-23. (MRS proceedings). https://doi.org/10.1557/opl.2011.1161