@inproceedings{61585bbd92224ab9a5fc26b572b6a842,
title = "Materials Characterization of CIGS solar cells on Top of CMOS chips",
abstract = "In the current work, we present a detailed study on the material properties of the CIGS layers, fabricated on top of the CMOS chips, and compare the results with the fabrication on standard glass substrates. Almost identical elemental composition on both glass and CMOS chips (within measurement error). From X-ray diffraction measurement, except two peaks from the Si <100> substrate, the diffraction peaks from CIGS solar cell CMOS chip and that on glass substrate coincide for all three temperatures. Helium ion microscope images of the cross-section and top view of the CIGS layers, shows that the grain size is suitable for high efficiency solar cells.",
keywords = "IR-79892, EWI-21622, METIS-285166",
author = "J. Lu and W. Liu and A.Y. Kovalgin and Y. Sun and J. Schmitz",
year = "2011",
month = jun,
day = "1",
doi = "10.1557/opl.2011.1161",
language = "English",
series = "MRS proceedings",
publisher = "Cambridge University Press",
pages = "e06--23",
editor = "R. Venkatasubramanian and H. Radousky and H. Liang",
booktitle = "Proceedings of 2011 MRS Spring Meeting",
address = "United Kingdom",
note = "MRS Spring Meeting 2011 : Amorphous and Polycrystalline Thin-Film Silicon Science and Technology ; Conference date: 25-04-2011 Through 29-04-2011",
}