Maximum Discrimination Analysis (MDA) as a Means for Dimension Reduction in Biometric Verification

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Workshop on Biometrics: Challenges arising from Theory to Practice
Publisher	The International Association for Pattern Recognition
Pages	31-34
Number of pages	4
Publication status	Published - Aug 2004
Event	Workshop on Biometrics: Challenges arising from Theory to Practice - Cambridge, UK Duration: 1 Aug 2004 → 1 Aug 2004

Workshop	Workshop on Biometrics: Challenges arising from Theory to Practice
Period	1/08/04 → 1/08/04

Keywords

@inproceedings{abd5310cd8fc46328fb029c1eb418620,

title = "Maximum Discrimination Analysis (MDA) as a Means for Dimension Reduction in Biometric Verification",

keywords = "EWI-786, SCS-Safety",

author = "Veldhuis, {Raymond N.J.} and A.M. Bazen",

note = "Imported from DIES; Workshop on Biometrics: Challenges arising from Theory to Practice ; Conference date: 01-08-2004 Through 01-08-2004",

year = "2004",

month = aug,

language = "Undefined",

pages = "31--34",

booktitle = "Workshop on Biometrics: Challenges arising from Theory to Practice",

publisher = "The International Association for Pattern Recognition",

}

Maximum Discrimination Analysis (MDA) as a Means for Dimension Reduction in Biometric Verification. / Veldhuis, Raymond N.J.; Bazen, A.M.
Workshop on Biometrics: Challenges arising from Theory to Practice. The International Association for Pattern Recognition, 2004. p. 31-34.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Maximum Discrimination Analysis (MDA) as a Means for Dimension Reduction in Biometric Verification

AU - Veldhuis, Raymond N.J.

AU - Bazen, A.M.

N1 - Imported from DIES

PY - 2004/8

Y1 - 2004/8

KW - EWI-786

KW - SCS-Safety

M3 - Conference contribution

SP - 31

EP - 34

BT - Workshop on Biometrics: Challenges arising from Theory to Practice

PB - The International Association for Pattern Recognition

T2 - Workshop on Biometrics: Challenges arising from Theory to Practice

Y2 - 1 August 2004 through 1 August 2004

ER -