Measurement and Artificial Neural Networks

Z. Houkes, Paulus P.L. Regtien, W.C. Heerens, R. van Vliet, Theodorus S.J. Lammerink

    Research output: Book/ReportBookAcademic

    Original languageUndefined
    Place of PublicationUtrecht, The Netherlands
    PublisherStichting Meet- en Besturingstechnologie
    Number of pages92
    ISBN (Print)90-801307-2-9
    Publication statusPublished - 1993

    Keywords

    • METIS-112439

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