Measurement and Artificial Neural Networks

Z. Houkes, Paulus P.L. Regtien, W.C. Heerens, R. van Vliet, Theodorus S.J. Lammerink

    Research output: Book/ReportBookAcademic

    Original languageUndefined
    Place of PublicationUtrecht, The Netherlands
    PublisherStichting Meet- en Besturingstechnologie
    Number of pages92
    ISBN (Print)90-801307-2-9
    Publication statusPublished - 1993

    Keywords

    • METIS-112439

    Cite this

    Houkes, Z., Regtien, P. P. L., Heerens, W. C., van Vliet, R., & Lammerink, T. S. J. (1993). Measurement and Artificial Neural Networks. Utrecht, The Netherlands: Stichting Meet- en Besturingstechnologie.