Measurement and Artificial Neural Networks

Z. Houkes, Paulus P.L. Regtien, W.C. Heerens, R. van Vliet, Theodorus S.J. Lammerink

    Research output: Book/Report › Book › Academic

    Original languageUndefined
    Place of PublicationUtrecht, The Netherlands
    PublisherStichting Meet- en Besturingstechnologie
    Number of pages92
    ISBN (Print)90-801307-2-9
    Publication statusPublished - 1993

    Keywords

    • METIS-112439

    Cite this

    Houkes, Z., Regtien, P. P. L., Heerens, W. C., van Vliet, R., & Lammerink, T. S. J. (1993). Measurement and Artificial Neural Networks. Utrecht, The Netherlands: Stichting Meet- en Besturingstechnologie.
    Houkes, Z. ; Regtien, Paulus P.L. ; Heerens, W.C. ; van Vliet, R. ; Lammerink, Theodorus S.J. / Measurement and Artificial Neural Networks. Utrecht, The Netherlands : Stichting Meet- en Besturingstechnologie, 1993. 92 p.
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    keywords = "METIS-112439",
    author = "Z. Houkes and Regtien, {Paulus P.L.} and W.C. Heerens and {van Vliet}, R. and Lammerink, {Theodorus S.J.}",
    year = "1993",
    language = "Undefined",
    isbn = "90-801307-2-9",
    publisher = "Stichting Meet- en Besturingstechnologie",

    }

    Houkes, Z, Regtien, PPL, Heerens, WC, van Vliet, R & Lammerink, TSJ 1993, Measurement and Artificial Neural Networks. Stichting Meet- en Besturingstechnologie, Utrecht, The Netherlands.

    Measurement and Artificial Neural Networks. / Houkes, Z.; Regtien, Paulus P.L.; Heerens, W.C.; van Vliet, R.; Lammerink, Theodorus S.J.

    Utrecht, The Netherlands : Stichting Meet- en Besturingstechnologie, 1993. 92 p.

    Research output: Book/Report › Book › Academic

    TY - BOOK

    T1 - Measurement and Artificial Neural Networks

    AU - Houkes, Z.

    AU - Regtien, Paulus P.L.

    AU - Heerens, W.C.

    AU - van Vliet, R.

    AU - Lammerink, Theodorus S.J.

    PY - 1993

    Y1 - 1993

    KW - METIS-112439

    M3 - Book

    SN - 90-801307-2-9

    BT - Measurement and Artificial Neural Networks

    PB - Stichting Meet- en Besturingstechnologie

    CY - Utrecht, The Netherlands

    ER -

    Houkes Z, Regtien PPL, Heerens WC, van Vliet R, Lammerink TSJ. Measurement and Artificial Neural Networks. Utrecht, The Netherlands: Stichting Meet- en Besturingstechnologie, 1993. 92 p.