Measurement of the Low Frequency Noise of MOSFETs Under Large Signal RF Excitation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of ProRisc 2002
Place of Publication	Veldhoven
Pages	-
Number of pages	2
Publication status	Published - 28 Nov 2002
Event	13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002 - Veldhoven, Netherlands Duration: 28 Nov 2002 → 29 Nov 2002 Conference number: 13

Workshop	13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002
Country/Territory	Netherlands
City	Veldhoven
Period	28/11/02 → 29/11/02

Keywords

@inproceedings{7c6488bc17624ae19a9054b3afd050e8,

title = "Measurement of the Low Frequency Noise of MOSFETs Under Large Signal RF Excitation",

keywords = "METIS-207348",

author = "{van der Wel}, A.P. and Klumperink, {Eric A.M.} and Bram Nauta",

year = "2002",

month = nov,

day = "28",

language = "Undefined",

isbn = "9073461332",

pages = "--",

booktitle = "Proceedings of ProRisc 2002",

note = "13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002 ; Conference date: 28-11-2002 Through 29-11-2002",

}

TY - GEN

T1 - Measurement of the Low Frequency Noise of MOSFETs Under Large Signal RF Excitation

AU - van der Wel, A.P.

AU - Klumperink, Eric A.M.

AU - Nauta, Bram

N1 - Conference code: 13

PY - 2002/11/28

Y1 - 2002/11/28

KW - METIS-207348

M3 - Conference contribution

SN - 9073461332

SP - -

BT - Proceedings of ProRisc 2002

CY - Veldhoven

T2 - 13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002

Y2 - 28 November 2002 through 29 November 2002

ER -