Measurement of the Low Frequency Noise of MOSFETs Under Large Signal RF Excitation

A.P. van der Wel, Eric A.M. Klumperink, Bram Nauta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of ProRisc 2002
    Place of PublicationVeldhoven
    Pages-
    Number of pages2
    Publication statusPublished - 28 Nov 2002
    Event13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002 - Veldhoven, Netherlands
    Duration: 28 Nov 200229 Nov 2002
    Conference number: 13

    Workshop

    Workshop13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002
    CountryNetherlands
    CityVeldhoven
    Period28/11/0229/11/02

    Keywords

    • METIS-207348

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