Medipix 2 detector applied to Low Energy Electron Microscopy

Raoul van Gastel, I. Sikharulidze, S. Schramm, J.P. Abrahams, Bene Poelsema, R.M. Tromp, S.J. van der Molen

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Publication statusPublished - 9 Aug 2010
Event7th International LEEM/PEEM Workshop 2010 - Grand Hyatt Hotel, New York, United States
Duration: 8 Aug 201013 Aug 2010
Conference number: 7


Conference7th International LEEM/PEEM Workshop 2010
Abbreviated titleLEEM/PEERM 2010
Country/TerritoryUnited States
CityNew York


  • METIS-273922

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