Abstract
Low energy electron microscopy (LEEM) and photo-emission electron microscopy (PEEM) traditionally use microchannel plates (MCPs), a phosphor screen and a CCD-camera to record images and diffraction patterns. In recent years, however, MCPs have become a limiting factor for these types of microscopy. Here, we report on a successful test series using a solid state hybrid pixel detector, Medipix 2, in LEEM and PEEM. Medipix 2 is a background-free detector with an infinite dynamic range, making it very promising for both real-space imaging and spectroscopy. We demonstrate a significant enhancement of both image contrast and resolution, as compared to MCPs. Since aging of the Medipix 2 detector is negligible for the electron energies used in LEEM/PEEM, we expect Medipix to become the detector of choice for a new generation of systems.
Original language | English |
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Pages (from-to) | 33-35 |
Number of pages | 3 |
Journal | Ultramicroscopy |
Volume | 110 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2009 |
Keywords
- Photoelectron emission microscopy
- IR-80132
- Low energy electron microscopy
- Pixel detector
- metis-262677