Metamodel for Tracing Concerns across the Life Cycle

B. Tekinerdogan, C. Hofmann, Mehmet Aksit, J. Bakker

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
    47 Downloads (Pure)


    Several aspect-oriented approaches have been proposed to specify aspects at different phases in the software life cycle. Aspects can appear within a phase, be refined or mapped to other aspects in later phases, or even disappear. Tracing aspects is necessary to support understandability and maintainability of software systems. Although several approaches have been introduced to address traceability of aspects, two important limitations can be observed. First, tracing is not yet tackled for the entire life cycle. Second, the traceability model that is applied usually refers to elements of specific aspect languages, thereby limiting the reusability of the adopted traceability model.We propose the concern traceability metamodel (CTM) that enables traceability of concerns throughout the life cycle, and which is independent from the aspect languages that are used. CTM can be enhanced to provide additional properties for tracing, and be instantiated to define customized traceability models with respect to the required aspect languages. We have implemented CTM in the tool M-Trace, that uses XML-based representations of the models and XQuery queries to represent tracing information. CTM and M-Trace are illustrated for a Concurrent Versioning System to trace aspects from the requirements level to architecture design level and the implementation.
    Original languageUndefined
    Title of host publicationEarly Aspects: Current Challenges and Future Directions: 10th international workshop
    EditorsA.M.D. Moreira, J Grundy
    Place of PublicationBerlin
    Number of pages20
    ISBN (Print)978-3-540-76810-4
    Publication statusPublished - 12 Dec 2007

    Publication series

    NameLecture Notes in Computer Science
    PublisherSpringer Verlag
    ISSN (Print)0302-9743
    ISSN (Electronic)1611-3349


    • EWI-10253
    • IR-60277
    • METIS-247028

    Cite this