Metamodel for Tracing Concerns across the Life Cycle

B. Tekinerdogan, C. Hofmann, Mehmet Aksit, J. Bakker

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
    38 Downloads (Pure)

    Abstract

    Several aspect-oriented approaches have been proposed to specify aspects at different phases in the software life cycle. Aspects can appear within a phase, be refined or mapped to other aspects in later phases, or even disappear. Tracing aspects is necessary to support understandability and maintainability of software systems. Although several approaches have been introduced to address traceability of aspects, two important limitations can be observed. First, tracing is not yet tackled for the entire life cycle. Second, the traceability model that is applied usually refers to elements of specific aspect languages, thereby limiting the reusability of the adopted traceability model.We propose the concern traceability metamodel (CTM) that enables traceability of concerns throughout the life cycle, and which is independent from the aspect languages that are used. CTM can be enhanced to provide additional properties for tracing, and be instantiated to define customized traceability models with respect to the required aspect languages. We have implemented CTM in the tool M-Trace, that uses XML-based representations of the models and XQuery queries to represent tracing information. CTM and M-Trace are illustrated for a Concurrent Versioning System to trace aspects from the requirements level to architecture design level and the implementation.
    Original languageUndefined
    Title of host publicationEarly Aspects: Current Challenges and Future Directions: 10th international workshop
    EditorsA.M.D. Moreira, J Grundy
    Place of PublicationBerlin
    PublisherSpringer
    Pages175-194
    Number of pages20
    ISBN (Print)978-3-540-76810-4
    DOIs
    Publication statusPublished - 12 Dec 2007

    Publication series

    NameLecture Notes in Computer Science
    PublisherSpringer Verlag
    Volume4765
    ISSN (Print)0302-9743
    ISSN (Electronic)1611-3349

    Keywords

    • EWI-10253
    • IR-60277
    • METIS-247028

    Cite this

    Tekinerdogan, B., Hofmann, C., Aksit, M., & Bakker, J. (2007). Metamodel for Tracing Concerns across the Life Cycle. In A. M. D. Moreira, & J. Grundy (Eds.), Early Aspects: Current Challenges and Future Directions: 10th international workshop (pp. 175-194). (Lecture Notes in Computer Science; Vol. 4765). Berlin: Springer. https://doi.org/10.1007/978-3-540-76811-1_10, https://doi.org/10.1007/978-3-540-76811-1