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Method, apparatus and computer program for measuring and processing a spectrum of an XUV light source from soft x-rays to infrared wavelengths

Research output: Patent

Original languageEnglish
Patent number2017729 IDF
IPC164742.NL Dokter Octrooibureau,WO2018/084708 A1
Priority date7/11/16
Publication statusPublished - 11 May 2018

Keywords

  • METIS-319120

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