Abstract
The present disclosure generally relates to thin-film deposition methods, to structures formed using the methods, and to systems for performing the methods. More particularly, the disclosure relates to methods of selectively depositing gallium nitride to form device structures and to related structures and systems.
Original language | English |
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Patent number | 62/779684 |
Filing date | 12/12/19 |
Publication status | Published - 18 Jun 2020 |