Microbeam back-reflection x-ray camera with arrangement for positioning a pre-selected area

F.J. ter Avest, J.A. Klostermann

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A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.
Original languageEnglish
Pages (from-to)950-952
JournalJournal of Physics E: Journal of scientific instruments
Issue number11
Publication statusPublished - 1969
Externally publishedYes

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