Abstract
A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.
| Original language | English |
|---|---|
| Pages (from-to) | 950-952 |
| Journal | Journal of Physics E: Journal of scientific instruments |
| Volume | 2 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1969 |
| Externally published | Yes |