A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.
|Journal||Journal of Physics E: Journal of scientific instruments|
|Publication status||Published - 1969|
ter Avest, F. J., & Klostermann, J. A. (1969). Microbeam back-reflection x-ray camera with arrangement for positioning a pre-selected area. Journal of Physics E: Journal of scientific instruments, 2(11), 950-952. https://doi.org/10.1088/0022-3735/2/11/311