Microbeam back-reflection x-ray camera with arrangement for positioning a pre-selected area

F.J. ter Avest, J.A. Klostermann

Research output: Contribution to journalArticleAcademic

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Abstract

A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.
Original languageEnglish
Pages (from-to)950-952
JournalJournal of Physics E: Journal of scientific instruments
Volume2
Issue number11
DOIs
Publication statusPublished - 1969
Externally publishedYes

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Cameras
X rays
Creep
Grain boundaries
Microscopes
Lead
Wire
Aluminum
Glass
Wavelength

Cite this

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abstract = "A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.",
author = "{ter Avest}, F.J. and J.A. Klostermann",
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doi = "10.1088/0022-3735/2/11/311",
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journal = "Measurement science and technology",
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Microbeam back-reflection x-ray camera with arrangement for positioning a pre-selected area. / ter Avest, F.J.; Klostermann, J.A.

In: Journal of Physics E: Journal of scientific instruments, Vol. 2, No. 11, 1969, p. 950-952.

Research output: Contribution to journalArticleAcademic

TY - JOUR

T1 - Microbeam back-reflection x-ray camera with arrangement for positioning a pre-selected area

AU - ter Avest, F.J.

AU - Klostermann, J.A.

PY - 1969

Y1 - 1969

N2 - A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.

AB - A high precision back-reflection x-ray microbeam camera is described which uses a very accurate translation of a slide to move a point or a specimen selected by the cross-wires of a microscope into the centre of a very narrow x-ray beam. This positioning can be performed with an accuracy to better than 2 μm. The use of a lead glass capillary collimator, diameter 10 μm, is shown to give an intense x-ray beam and also to change the x-ray spectrum by selection of longer wavelengths. The microbeam camera has been used to study grain boundary migration during creep in aluminium by a Laue technique.

U2 - 10.1088/0022-3735/2/11/311

DO - 10.1088/0022-3735/2/11/311

M3 - Article

VL - 2

SP - 950

EP - 952

JO - Measurement science and technology

JF - Measurement science and technology

SN - 0957-0233

IS - 11

ER -