Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

Leon Abelmann; Sakhrat K. Khizroev; Dmitri Litvinov; Jian-Gang Zhu; James A. Bain; Mark H. Kryder; K. Ramstöck; J.C. Lodder

doi:10.1063/1.372795

Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

Leon Abelmann, Sakhrat K. Khizroev, Dmitri Litvinov, Jian-Gang Zhu, James A. Bain, Mark H. Kryder, K. Ramstöck, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

19 Citations (Scopus)

Abstract

In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

Original language	Undefined
Pages (from-to)	6636-6638
Number of pages	3
Journal	Journal of Applied Physics
Volume	87
Issue number	9
DOIs	https://doi.org/10.1063/1.372795
Publication status	Published - 2000

Keywords

IR-62932
METIS-112304
EWI-5367
SMI-TST: From 2006 in EWI-TST
TST-uSPAM: micro Scanning Probe Array Memory
SMI-MMS: MICROMAGNETIC SIMULATIONS

Access to Document

10.1063/1.372795

http://eprints.eemcs.utwente.nl/secure2/5367/01/ABELMANN2000.PDF

Cite this

Abelmann, L., Khizroev, S. K., Litvinov, D., Zhu, J-G., Bain, J. A., Kryder, M. H., ... Lodder, J. C. (2000). Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. Journal of Applied Physics, 87(9), 6636-6638. https://doi.org/10.1063/1.372795

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author = "Leon Abelmann and Khizroev, {Sakhrat K.} and Dmitri Litvinov and Jian-Gang Zhu and Bain, {James A.} and Kryder, {Mark H.} and K. Ramst{\"o}ck and J.C. Lodder",

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AU - Abelmann, Leon

AU - Khizroev, Sakhrat K.

AU - Litvinov, Dmitri

AU - Zhu, Jian-Gang

AU - Bain, James A.

AU - Kryder, Mark H.

AU - Ramstöck, K.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 2000

Y1 - 2000

N2 - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

AB - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

KW - IR-62932

KW - METIS-112304

KW - EWI-5367

KW - SMI-TST: From 2006 in EWI-TST

KW - TST-uSPAM: micro Scanning Probe Array Memory

KW - SMI-MMS: MICROMAGNETIC SIMULATIONS

U2 - 10.1063/1.372795

DO - 10.1063/1.372795

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ER -