In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.
- SMI-TST: From 2006 in EWI-TST
- TST-uSPAM: micro Scanning Probe Array Memory
- SMI-MMS: MICROMAGNETIC SIMULATIONS