Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

Leon Abelmann, Sakhrat K. Khizroev, Dmitri Litvinov, Jian-Gang Zhu, James A. Bain, Mark H. Kryder, K. Ramstöck, J.C. Lodder

Research output: Contribution to journalArticleAcademicpeer-review

19 Citations (Scopus)

Abstract

In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.
Original languageUndefined
Pages (from-to)6636-6638
Number of pages3
JournalJournal of applied physics
Volume87
Issue number9
DOIs
Publication statusPublished - 2000

Keywords

  • IR-62932
  • METIS-112304
  • EWI-5367
  • SMI-TST: From 2006 in EWI-TST
  • TST-uSPAM: micro Scanning Probe Array Memory
  • SMI-MMS: MICROMAGNETIC SIMULATIONS

Cite this

Abelmann, L., Khizroev, S. K., Litvinov, D., Zhu, J-G., Bain, J. A., Kryder, M. H., ... Lodder, J. C. (2000). Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. Journal of applied physics, 87(9), 6636-6638. https://doi.org/10.1063/1.372795
Abelmann, Leon ; Khizroev, Sakhrat K. ; Litvinov, Dmitri ; Zhu, Jian-Gang ; Bain, James A. ; Kryder, Mark H. ; Ramstöck, K. ; Lodder, J.C. / Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. In: Journal of applied physics. 2000 ; Vol. 87, No. 9. pp. 6636-6638.
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abstract = "In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.",
keywords = "IR-62932, METIS-112304, EWI-5367, SMI-TST: From 2006 in EWI-TST, TST-uSPAM: micro Scanning Probe Array Memory, SMI-MMS: MICROMAGNETIC SIMULATIONS",
author = "Leon Abelmann and Khizroev, {Sakhrat K.} and Dmitri Litvinov and Jian-Gang Zhu and Bain, {James A.} and Kryder, {Mark H.} and K. Ramst{\"o}ck and J.C. Lodder",
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year = "2000",
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volume = "87",
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journal = "Journal of applied physics",
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publisher = "American Institute of Physics",
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}

Abelmann, L, Khizroev, SK, Litvinov, D, Zhu, J-G, Bain, JA, Kryder, MH, Ramstöck, K & Lodder, JC 2000, 'Micromagnetic simulation of an ultrasmall single-pole perpendicular write head' Journal of applied physics, vol. 87, no. 9, pp. 6636-6638. https://doi.org/10.1063/1.372795

Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. / Abelmann, Leon; Khizroev, Sakhrat K.; Litvinov, Dmitri; Zhu, Jian-Gang; Bain, James A.; Kryder, Mark H.; Ramstöck, K.; Lodder, J.C.

In: Journal of applied physics, Vol. 87, No. 9, 2000, p. 6636-6638.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

AU - Abelmann, Leon

AU - Khizroev, Sakhrat K.

AU - Litvinov, Dmitri

AU - Zhu, Jian-Gang

AU - Bain, James A.

AU - Kryder, Mark H.

AU - Ramstöck, K.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 2000

Y1 - 2000

N2 - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

AB - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

KW - IR-62932

KW - METIS-112304

KW - EWI-5367

KW - SMI-TST: From 2006 in EWI-TST

KW - TST-uSPAM: micro Scanning Probe Array Memory

KW - SMI-MMS: MICROMAGNETIC SIMULATIONS

U2 - 10.1063/1.372795

DO - 10.1063/1.372795

M3 - Article

VL - 87

SP - 6636

EP - 6638

JO - Journal of applied physics

JF - Journal of applied physics

SN - 0021-8979

IS - 9

ER -