Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

Leon Abelmann, Sakhrat K. Khizroev, Dmitri Litvinov, Jian-Gang Zhu, James A. Bain, Mark H. Kryder, K. Ramstöck, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    19 Citations (Scopus)

    Abstract

    In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.
    Original languageUndefined
    Pages (from-to)6636-6638
    Number of pages3
    JournalJournal of applied physics
    Volume87
    Issue number9
    DOIs
    Publication statusPublished - 2000

    Keywords

    • IR-62932
    • METIS-112304
    • EWI-5367
    • SMI-TST: From 2006 in EWI-TST
    • TST-uSPAM: micro Scanning Probe Array Memory
    • SMI-MMS: MICROMAGNETIC SIMULATIONS

    Cite this

    Abelmann, L., Khizroev, S. K., Litvinov, D., Zhu, J-G., Bain, J. A., Kryder, M. H., ... Lodder, J. C. (2000). Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. Journal of applied physics, 87(9), 6636-6638. https://doi.org/10.1063/1.372795
    Abelmann, Leon ; Khizroev, Sakhrat K. ; Litvinov, Dmitri ; Zhu, Jian-Gang ; Bain, James A. ; Kryder, Mark H. ; Ramstöck, K. ; Lodder, J.C. / Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. In: Journal of applied physics. 2000 ; Vol. 87, No. 9. pp. 6636-6638.
    @article{453d0569cea8401d8d335ec18b429db4,
    title = "Micromagnetic simulation of an ultrasmall single-pole perpendicular write head",
    abstract = "In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.",
    keywords = "IR-62932, METIS-112304, EWI-5367, SMI-TST: From 2006 in EWI-TST, TST-uSPAM: micro Scanning Probe Array Memory, SMI-MMS: MICROMAGNETIC SIMULATIONS",
    author = "Leon Abelmann and Khizroev, {Sakhrat K.} and Dmitri Litvinov and Jian-Gang Zhu and Bain, {James A.} and Kryder, {Mark H.} and K. Ramst{\"o}ck and J.C. Lodder",
    note = "Imported from SMI Reference manager",
    year = "2000",
    doi = "10.1063/1.372795",
    language = "Undefined",
    volume = "87",
    pages = "6636--6638",
    journal = "Journal of applied physics",
    issn = "0021-8979",
    publisher = "American Institute of Physics",
    number = "9",

    }

    Abelmann, L, Khizroev, SK, Litvinov, D, Zhu, J-G, Bain, JA, Kryder, MH, Ramstöck, K & Lodder, JC 2000, 'Micromagnetic simulation of an ultrasmall single-pole perpendicular write head', Journal of applied physics, vol. 87, no. 9, pp. 6636-6638. https://doi.org/10.1063/1.372795

    Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. / Abelmann, Leon; Khizroev, Sakhrat K.; Litvinov, Dmitri; Zhu, Jian-Gang; Bain, James A.; Kryder, Mark H.; Ramstöck, K.; Lodder, J.C.

    In: Journal of applied physics, Vol. 87, No. 9, 2000, p. 6636-6638.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

    AU - Abelmann, Leon

    AU - Khizroev, Sakhrat K.

    AU - Litvinov, Dmitri

    AU - Zhu, Jian-Gang

    AU - Bain, James A.

    AU - Kryder, Mark H.

    AU - Ramstöck, K.

    AU - Lodder, J.C.

    N1 - Imported from SMI Reference manager

    PY - 2000

    Y1 - 2000

    N2 - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

    AB - In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.

    KW - IR-62932

    KW - METIS-112304

    KW - EWI-5367

    KW - SMI-TST: From 2006 in EWI-TST

    KW - TST-uSPAM: micro Scanning Probe Array Memory

    KW - SMI-MMS: MICROMAGNETIC SIMULATIONS

    U2 - 10.1063/1.372795

    DO - 10.1063/1.372795

    M3 - Article

    VL - 87

    SP - 6636

    EP - 6638

    JO - Journal of applied physics

    JF - Journal of applied physics

    SN - 0021-8979

    IS - 9

    ER -