In single-pole heads with a pole tip cross section trimmed down to 1003200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section.
- SMI-TST: From 2006 in EWI-TST
- TST-uSPAM: micro Scanning Probe Array Memory
- SMI-MMS: MICROMAGNETIC SIMULATIONS
Abelmann, L., Khizroev, S. K., Litvinov, D., Zhu, J-G., Bain, J. A., Kryder, M. H., ... Lodder, J. C. (2000). Micromagnetic simulation of an ultrasmall single-pole perpendicular write head. Journal of Applied Physics, 87(9), 6636-6638. https://doi.org/10.1063/1.372795