Micromolded Near-field optical probes

J.P. Brugger, B.J. Kim, N.F. van Hulst

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	SXM4. 4th International Conference on the Development and Technological Application of Scanning Probe Methods
Place of Publication	Muenster, Germany
Pages	11-11
Number of pages	1
Publication status	Published - 25 Sep 2000
Event	4th International Conference on the Development and Technological Application of Scanning Probe Methods, SXM4 - Munster, Germany Duration: 25 Sep 2000 → 27 Sep 2000

Conference	4th International Conference on the Development and Technological Application of Scanning Probe Methods, SXM4
Period	25/09/00 → 27/09/00
Other	25-27 September 2000

Keywords

@inproceedings{f7520625f52b43e1b9336b26026eadaf,

title = "Micromolded Near-field optical probes",

keywords = "IR-25383, METIS-130184",

author = "J.P. Brugger and B.J. Kim and {van Hulst}, N.F.",

year = "2000",

month = sep,

day = "25",

language = "Undefined",

pages = "11--11",

booktitle = "SXM4. 4th International Conference on the Development and Technological Application of Scanning Probe Methods",

note = "null ; Conference date: 25-09-2000 Through 27-09-2000",

}

TY - GEN

T1 - Micromolded Near-field optical probes

AU - Brugger, J.P.

AU - Kim, B.J.

AU - van Hulst, N.F.

PY - 2000/9/25

Y1 - 2000/9/25

KW - IR-25383

KW - METIS-130184

M3 - Conference contribution

SP - 11

EP - 11

BT - SXM4. 4th International Conference on the Development and Technological Application of Scanning Probe Methods

CY - Muenster, Germany

Y2 - 25 September 2000 through 27 September 2000

ER -