Micromolded Near-field optical probes

J.P. Brugger, B.J. Kim, N.F. van Hulst

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined
Title of host publicationSXM4. 4th International Conference on the Development and Technological Application of Scanning Probe Methods
Place of PublicationMuenster, Germany
Pages11-11
Number of pages1
Publication statusPublished - 25 Sept 2000
Event4th International Conference on the Development and Technological Application of Scanning Probe Methods, SXM4 - Munster, Germany
Duration: 25 Sept 200027 Sept 2000

Conference

Conference4th International Conference on the Development and Technological Application of Scanning Probe Methods, SXM4
Period25/09/0027/09/00
Other25-27 September 2000

Keywords

  • IR-25383
  • METIS-130184

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